Ujjwal Guin, Ph.D., IEEE Senior Member

Godbold Associate Professor
Co-Graduate Program Officer (Co-GPO)
Department of Electrical and Computer Engineering
Auburn University
325 Broun Hall, Auburn, AL 36849-5201, USA
Email: ujjwal.guin at auburn dot edu
Phone: (334) 844-1835 (Office)
[Curriculum vitae][Google Scholar][Research Gate]

Trusted Electronic Systems


Due to globalization, it is becoming increasingly difficult to ensure the security, integrity, and authenticity of electronic systems as they have been manufactured in environments of limited trust that in particular lack relevant government or other appropriate oversight, and then travel across the globe through intermediaries in the supply chain before being deployed. These factors make it virtually impossible to gauge the origin of these systems and their components, and to track their route in the supply chain. Numerous incidents have highlighted the far-reaching penetration of such counterfeit devices into the electronics supply chain, including cloned systems (network hardware) into the United States defense supply chain. Today’s electronic systems are increasingly vulnerable to counterfeiting and piracy due to the enhanced capability of adversaries. Moreover, the recent growth of the Internet of Things (IoT) and Cyber-Physical Systems (CPS) creates an opportunity to use a wide variety of devices (systems). In this connected environment, billions of devices (“things”) have direct interactions between the physical world and computer-based systems. These edge devices are constituted from a wide variety of electronic and electromechanical devices such as smart thermostats, lights, watches, mobile phones, sensors, actuators, and many others. It is reported that there will be upwards of 41.6 billion devices connected by 2025. These devices are usually designed to operate on very low-power and so often have limited hardware resources.

Ensuring the security of such systems is of great concern as an adversary can create a backdoor or insert a malware in such systems to bypass the existing security modules. The reliability of such systems could also be questionable as the parts used in these systems may be counterfeit and/or of inferior quality. It is of prime importance to develop solutions that can prevent an adversary from creating these counterfeit and cloned systems.

Publications

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Journal Papers
  1. W. Wang, A. D. Singh, and U. Guin, "A Systematic Bit Selection Method for Robust SRAM PUFs," Journal of Electronic Testing: Theory and Applications (JETTA), pp. 301-311, 2022. [LINK] [PDF] [BibTeX: wang2022systematic]
  2. A. Jain, Z. Zhou and U. Guin, "TAAL: Tampering Attack on Any Key-based Logic Locked Circuits," in ACM Transactions on Design Automation of Electronic Systems (TODAES), pp. 1-22, 2021. [PDF] [BibTeX: jain2021taal]
  3. W. Wang, U. Guin, and A. D. Singh, "Aging-Resilient SRAM-based Ture Random Number Generator for Lightweight Devices," Journal of Electronic Testing: Theory and Applications (JETTA), pp. 301-311, 2020. [LINK] [PDF] [BibTeX: wang2020aging]
  4. J. Mahmod, and U. Guin, "Robust, Low-Cost and Secure Authentication Scheme for IoT Applications," Cryptography, pp. 1-20, 2020. [LINK] [PDF] [BibTeX: mahmod2020robust]
  5. P. Cui, U. Guin, A. Skjellum, and D. Umphress, "Blockchain in IoT: Current Trends, Challenges and Future Roadmap," Journal of Hardware and Systems Security (HaSS), pp. 338-364, 2019. [LINK] [PDF] [BibTeX: cui2019blockchainSurvey]
  6. B. Cyr, J. Mahmod, and U. Guin, "Low-Cost and Secure Firmware Obfuscation Method for Protecting Electronic Systems from Cloning", IEEE Internet of Things Journal, pp. 3700-3711, 2019, [LINK] [PDF] [BibTeX: cyr2019low].
  7. S. Wang, A. Ali, U. Guin, and A. Skjellum, "IoTCP: A Novel Trusted Computing Protocol for IoT", Journal of The Colloquium for Information System Security Education (CISSE), pp. 165-180, 2018, [LINK] [BibTeX: wang2018iotcp].
  8. M. Alam, M. Tehranipoor, and U. Guin, “TSensors Vision, Infrastructure and Security Challenges in Trillion Sensor Era: Current Trends and Future Directions," Journal of Hardware and Systems Security (HaSS), pp. 311-327, 2017. [LINK] [PDF] [BibTeX: alam2017tsensors]
  9. M. Tehranipoor, U. Guin, and S. Bhunia, “Invasion of the Hardware Snatchers: Cloned Electronics Pollute the Market," IEEE Spectrum, pp. 36-41, 2017. [LINK] [BibTeX: tehranipoor2017invasion]
  10. U. Guin, S. Bhunia, D. Forte, and M. Tehranipoor, “SMA: A System-Level Mutual Authentication for Protecting Electronic Hardware and Firmware," IEEE Transactions on Dependable and Secure Computing (TDSC), pp. 265-278, 2016. [LINK] [PDF] [BibTeX: guin2016sma]
Conference Papers
  1. A. Jain, Z. Zhou, and U. Guin, “Survey of Recent Developments for Hardware Trojan Detection,” in IEEE International Symposium on Circuits & Systems (ISCAS), pp. 1-5, 2021. [PDF] [BibTeX: jain2021survey]
  2. A. Jain, and U. Guin, “A Novel Tampering Attack on AES Cores with Hardware Trojans,” in ITC-Asia, pp. 77-82, 2020. [PDF] [BibTeX: jain2020novel]
  3. A. Stern, D. Mehta, S. Tajik, U. Guin, F. Farahmandi and M. Tehranipoor, “SPARTA-COTS: A Laser Probing Approach for Sequential Trojan Detection in COTS Integrated Circuits," in IEEE Physical Assurance and Inspection of Electronics (PAINE), pp. 1-6, 2020. [LINK] [PDF] [BibTeX: stern2020sparta]
  4. P. Cui and U. Guin, “Countering Botnet of Things using Blockchain-Based Authenticity Framework," in IEEE Computer Society Annual Symposium on VLSI (ISVLSI), pp. 598-603, 2019. [LINK] [PDF] [BibTeX: cui2019countering]
  5. W. Wang, A. D. Singh, U. Guin, and A. Chatterjee, “Exploiting Power Supply Ramp Rate for Calibrating Cell Strength in SRAM PUFs," in IEEE Latin-American Test Symposium (LATS), pp. 1-6, 2018. [LINK] [PDF] [BibTeX: wang2018exploiting]
  6. U. Guin, A. D. Singh, M. Alam, J. Canedo, and A. Skjellum, “A Secure Low-Cost Edge Device Authentication Scheme for the Internet of Things," in International Conference on VLSI Design, pp. 85-90, 2018. [LINK] [PDF] [BibTeX: guin2018secure]
  7. Z. Zhou, U. Guin, and V. D. Agrawal, “Modeling and Test Generation for Combinational Hardware Trojans," in IEEE VLSI Test Symposium (VTS), pp. 1-6, 2018. [LINK] [PDF] [BibTeX: zhou2018modeling]