Ujjwal Guin, Ph.D., IEEE Senior Member

Godbold Associate Professor
Co-Graduate Program Officer (Co-GPO)
Department of Electrical and Computer Engineering
Auburn University
325 Broun Hall, Auburn, AL 36849-5201, USA
Email: ujjwal.guin at auburn dot edu
Phone: (334) 844-1835 (Office)
[Curriculum vitae][Google Scholar][Research Gate]

Awards & Honors

  • Best Paper, "Beware of Discarding Used SRAMs: Information is Stored Permanently," IEEE Physical Assurance and Inspection of Electronics (PAINE), 2022.

  • Best Paper Nomination, "Defect Characterization and Testing of Skyrmion-Based Logic Circuits," VLSI Test Symposium (VTS), 2021.

  • NSF CISE Research Initiation Initiative (CRII), 2018.

  • Most Downloaded Article, U. Guin, D. DiMase, and M. Tehranipoor, "Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead," Journal of Electronic Testing: Theory and Applications (JETTA), 2014.

  • Best Poster Nomination, "Low-cost On-Chip Structures for Combating Die andIC Recycling", PhD Forum at DAC, 2014.

  • Best Student Paper Award, U. Guin and M. Tehranipoor, "On Selection of Counterfeit IC Detection Methods," IEEE North Atlantic Test Workshop (NATW), 2013.


Student Awards Under My Supervision