Reliability Analysis for AI/ML Hardware, IEEE VLSI Test Symposium (VTS), 2021
Novel Attacks on Logic Locking, IEEE VLSI Test Symposium (VTS), 2020
The Recent Advance in Hardware Implementation of Post-Quantum Cryptography, IEEE VLSI Test Symposium (VTS), 2020
Special Session on Hardware Security, Asian Test Symposium (ATS), 2019
Reverse Engineering Track Co-Chair, International Symposium for Testing and Failure Analysis (ISTFA), 2018
◾ Technical Program Committee
IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2020-Present
International Test Conference (ITC), 2022-Present
IEEE Physical Assurance and Inspection of Electronics (PAINE), 2020-Present
VLSI Test Symposium (VTS), 2019-Present
International Conference on VLSI Design (VLSID), 2019-Present
IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2019-Present
IEEE International Conference on Blockchain, 2019-Present
ACM Great Lakes Symposium on VLSI (GLSVLSI), 2019-Present
Design Automation Conference (DAC), 2020-2022
International Workshop on Cyberspace Security and Artificial Intelligence, 2021
IEEE International Conference on Omni-Layer Intelligent Systems (COINS), 2021
International Symposium on Consumer Technologies (ISCT), 2019
IEEE International Conference on Computer Design (ICCD), 2018
IEEE Cyber Science and Technology Congress (CyberSciTech), 2018
International Symposium on Devices, Circuits and Systems (ISDCS), 2018
IEEE North Atlantic Test Workshop (NATW), 2018.
◾ Groups
Liaison of SAE G-19A Test Laboratory Standards Development Committee
for developing aerospace standard AS6171, 2015-Present
G-32 Cyber Physical Systems Security Committee, 2019-Present
Subgroup lead of AS6171/1: Suspect/Counterfeit Test Evaluation Method,
2016-2022
◾ Tutorials
Effective Low-Cost Strategies for Detecting Recycled Integrated Circuits, IEEE International Test Conference - India, 2024
Logic Locking: Current Trends, Attacks and Future Directions, International Conference on VLSI Design (VLSID), 2019
◾ Keynotes
7th International Symposium on Devices, Circuits and Systems (ISDCS), Kolkata, India, 2025, Title: \textit{Advancing Microelectronics Security in a Globalized Semiconductor Ecosystem.
◾ Invited Talks
Tessent Thursday Seminar, 2024, Title: Automatic Test Pattern Generation using SAT Attack.
Microelectronics Reliability and Qualification Workshop (MRQW), The Aerospace Corporation, El Segundo, CA, 2024, Title: Self-referencing Approaches Using Memory Power-up States for Detecting Recycled ICs.
Trust and Assurance Workshop, Electronics Division Meeting & Trust & Assurance Subcommittee Meeting, Arlington, VA, 2022, Title: Counterfeit Defect Coverage That Was Completed By The SAE G-19A Group.
Micro-Electronics Security Training (MEST) Center, Gainesville, FL, 2021, Title: Towards Resilient Approaches for Detecting Recycled ICs.
SRA Symposium on Hardware and Cyber-Physical Systems, Arlington, VA,
Dec. 2019, Title: Counterfeit Defect Coverage Analysis: Current Status
and Future Directions.
IEEE Electronic Design Process Symposium (EDPS), Milpitas, CA, Sept.
2018, Title: Cybersecurity Solutions in Hardware.
IEEE Microprocessor Test and Verification (MTV) Conference, Austin, TX,
Dec. 2017, Title:Mutual Authentication: A Robust Solution for Preventing
System-Level Cloning.
International Test Conference (ITC), Fort Worth, TX, Nov. 2017, Title:
Efficient Strategies for Combating Die and IC Recycling.
IEEE North Atlantic Test Workshop (NATW), Warwick, RI, Title: Efficient
Strategies for Detection and Avoidance of Counterfeit ICs.
◾ Panels
Panel Chair, Blockchain for supply chain, Safeguarding Critical System Supply Chains Against Compromise (Networks, Processes, Parts, Materials, Software, and Information), NSF Sponsored Workshop, CALCE, 2022
◾ Session Chairs
Design Automation Conference (DAC), 2017-2022
IEEE VLSI Test Symposium (VTS), 2017-Present
GLSVLSI, 2022-Present
International Test Conference (ITC), 2017-2021
IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2019
International Symposium for Testing and Failure Analysis (ISTFA), 2018
International Conference On Computer Aided Design (ICCAD), 2017-2018
IEEE International Conference on Blockchain, 2018
IEEE International Conference on Computer Design (ICCD), 2018
◾ Reviewer for
IEEE Transactions on VLSI Systems (TVLSI), 2015-Present
IEEE Transactions on Information Forensics & Security (TIFS), 2018-Present
Transactions on Computers (TC), 2017-Present
Journal of Electronic Testing: Theory and Applications (JETTA), 2012-Present
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2016-Present
ACM Transactions on Design Automation of Electronic Systems (TODAES), 2014-Present
Journal of Hardware and Systems Security (HASS), 2016-Present
IEEE Internet of Things Journal, 2019-Present
Journal on Emerging Technologies in Computing Systems (JETC), 2017-Present
IEEE Design & Test, 2014-2018
Computers in Industry, 2020
MDPI Cryptography, 2018
Integration, the VLSI Journal, 2018
Transactions on Multi-Scale Computing Systems, 2018
Future Generation Computer Systems, 2018
IEEE Transactions on Industrial Informatics (TII), 2018
Embedded Systems Letters, 2017
IEEE Transactions on Circuits and Systems (TCAS), 2017
IEEE Transactions on Dependable and Secure Computing (TDSC), 2016, 2017
IEEE Computer (COMSI), 2016
IEEE Transactions on Multi-Scale Computing Systems (TMSCS), 2015
IET Computers & Digital Techniques, 2014
◾ Judge for Poster
Sessions and Hardware Demos
IEEE International Symposium on Hardware Oriented Security and Trust
(HOST), 2017-2020;
Graduate Engineering Research Showcase, Auburn University,
2016-2020.
Hack@DAC at Design Automation Conference (DAC), 2017;
◾ Conference
Presentations
Design Automation Conference (DAC), 2022
GLSVLSI, 2022
IEEE International Symposium on Hardware Oriented Security and Trust
(HOST), 2018,2019
IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2019
IEEE VLSI Test Symposium (VTS), 2017, 2018;
International Conference on VLSI Design (VLSID), 2018, 2019;