Ujjwal Guin, Ph.D., IEEE Senior Member

Godbold Associate Professor
Co-Graduate Program Officer (Co-GPO)
Department of Electrical and Computer Engineering
Auburn University
325 Broun Hall, Auburn, AL 36849-5201, USA
Email: ujjwal.guin at auburn dot edu
Phone: (334) 844-1835 (Office)
[Curriculum vitae][Google Scholar][Research Gate]


Professional Activities and Service
Editorial Activities
  • Associate Editor, Journal of Electronic Testing: Theory and Applications (JETTA), 2022-Present
  • Associate Editor, Journal of Hardware and Systems Security (HaSS), 2022-Present
  • Guest Editor, IEEE Blockchain Technical Briefs, 2022
  • Guest Editor, IEEE Design & Test - SI:ITC2018.
Conference Organizing Committee
  • Vice-program Co-Chair, IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2024
  • Program Co-Chair, IEEE Physical Assurance and Inspection of Electronics (PAINE), 2023
  • Special Session Chair, GLSVLSI, 2023
  • Student Activities Chair, VLSI Test Symposium (VTS), 2021-Present
  • Finance Chair, IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2023
  • Chair, HOST 2022 Microelectronics Security Challenge, 2022
  • Registration Chair/Vice Finance, IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2021-2022
  • Vice Program Chair, CAD4 Security Workshop, DAC, 2022
  • Vice Program Chair, IEEE Physical Assurance and Inspection of Electronics (PAINE), 2022
  • Technical Program Co-Chair, IEEE International Test Conference - India, 2022
  • Publication Chair, IEEE International Conference on Omni-Layer Intelligent Systems (COINS), 2021
  • Registration Chair, IEEE Physical Assurance and Inspection of Electronics (PAINE), 2020
  • Audio/Video Chair, VLSI Test Symposium (VTS), 2019-2020
Session Organizer
  • Detection and Avoidance of Counterfeit ICs, IEEE International Test Conference - India, 2022
  • Security-Aware Computer Aided Electronic Design, Design Automation Conference (DAC), 2021
  • Reliability Analysis for AI/ML Hardware, IEEE VLSI Test Symposium (VTS), 2021
  • Novel Attacks on Logic Locking, IEEE VLSI Test Symposium (VTS), 2020
  • The Recent Advance in Hardware Implementation of Post-Quantum Cryptography, IEEE VLSI Test Symposium (VTS), 2020
  • Special Session on Hardware Security, Asian Test Symposium (ATS), 2019
  • Reverse Engineering Track Co-Chair, International Symposium for Testing and Failure Analysis (ISTFA), 2018
Technical Program Committee
  • IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2020-Present
  • International Test Conference (ITC), 2022-Present
  • IEEE Physical Assurance and Inspection of Electronics (PAINE), 2020-Present
  • VLSI Test Symposium (VTS), 2019-Present
  • International Conference on VLSI Design (VLSID), 2019-Present
  • IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2019-Present
  • IEEE International Conference on Blockchain, 2019-Present
  • ACM Great Lakes Symposium on VLSI (GLSVLSI), 2019-Present
  • Design Automation Conference (DAC), 2020-2022
  • International Workshop on Cyberspace Security and Artificial Intelligence, 2021
  • IEEE International Conference on Omni-Layer Intelligent Systems (COINS), 2021
  • International Symposium on Consumer Technologies (ISCT), 2019
  • IEEE International Conference on Computer Design (ICCD), 2018
  • IEEE Cyber Science and Technology Congress (CyberSciTech), 2018
  • International Symposium on Devices, Circuits and Systems (ISDCS), 2018
  • IEEE North Atlantic Test Workshop (NATW), 2018.
Groups
  • Liaison of SAE G-19A Test Laboratory Standards Development Committee for developing aerospace standard AS6171, 2015-Present
  • G-32 Cyber Physical Systems Security Committee, 2019-Present
  • Subgroup lead of AS6171/1: Suspect/Counterfeit Test Evaluation Method, 2016-2022
Tutorials
  • Logic Locking: Current Trends, Attacks and Future Directions, International Conference on VLSI Design (VLSID), 2019
Invited Talks
  • Trust and Assurance Workshop, Electronics Division Meeting & Trust & Assurance Subcommittee Meeting, Arlington, VA, 2022, Title: Counterfeit Defect Coverage That Was Completed By The SAE G-19A Group.
  • Micro-Electronics Security Training (MEST) Center, Gainesville, FL, 2021, Title: Towards Resilient Approaches for Detecting Recycled ICs.
  • SRA Symposium on Hardware and Cyber-Physical Systems, Arlington, VA, Dec. 2019, Title: Counterfeit Defect Coverage Analysis: Current Status and Future Directions.
  • IEEE Electronic Design Process Symposium (EDPS), Milpitas, CA, Sept. 2018, Title: Cybersecurity Solutions in Hardware.
  • IEEE Microprocessor Test and Verification (MTV) Conference, Austin, TX, Dec. 2017, Title:Mutual Authentication: A Robust Solution for Preventing System-Level Cloning.
  • International Test Conference (ITC), Fort Worth, TX, Nov. 2017, Title: Efficient Strategies for Combating Die and IC Recycling.
  • IEEE North Atlantic Test Workshop (NATW), Warwick, RI, Title: Efficient Strategies for Detection and Avoidance of Counterfeit ICs.
Panels
  • Panel Chair, Blockchain for supply chain, Safeguarding Critical System Supply Chains Against Compromise (Networks, Processes, Parts, Materials, Software, and Information), NSF Sponsored Workshop, CALCE, 2022
Session Chairs
  • Design Automation Conference (DAC), 2017-2022
  • IEEE VLSI Test Symposium (VTS), 2017-Present
  • GLSVLSI, 2022-Present
  • International Test Conference (ITC), 2017-2021
  • IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2019
  • International Symposium for Testing and Failure Analysis (ISTFA), 2018
  • International Conference On Computer Aided Design (ICCAD), 2017-2018
  • IEEE International Conference on Blockchain, 2018
  • IEEE International Conference on Computer Design (ICCD), 2018
Reviewer for
  • IEEE Transactions on VLSI Systems (TVLSI), 2015-Present
  • IEEE Transactions on Information Forensics & Security (TIFS), 2018-Present
  • Transactions on Computers (TC), 2017-Present
  • Journal of Electronic Testing: Theory and Applications (JETTA), 2012-Present
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2016-Present
  • ACM Transactions on Design Automation of Electronic Systems (TODAES), 2014-Present
  • Journal of Hardware and Systems Security (HASS), 2016-Present
  • IEEE Internet of Things Journal, 2019-Present
  • Journal on Emerging Technologies in Computing Systems (JETC), 2017-Present
  • IEEE Design & Test, 2014-2018
  • Computers in Industry, 2020
  • MDPI Cryptography, 2018
  • Integration, the VLSI Journal, 2018
  • Transactions on Multi-Scale Computing Systems, 2018
  • Future Generation Computer Systems, 2018
  • IEEE Transactions on Industrial Informatics (TII), 2018
  • Embedded Systems Letters, 2017
  • IEEE Transactions on Circuits and Systems (TCAS), 2017
  • IEEE Transactions on Dependable and Secure Computing (TDSC), 2016, 2017
  • IEEE Computer (COMSI), 2016
  • IEEE Transactions on Multi-Scale Computing Systems (TMSCS), 2015
  • IET Computers & Digital Techniques, 2014
Judge for Poster Sessions and Hardware Demos
  • IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2017-2020;
  • Graduate Engineering Research Showcase, Auburn University, 2016-2020.
  • Hack@DAC at Design Automation Conference (DAC), 2017;
Conference Presentations
  • Design Automation Conference (DAC), 2022
  • GLSVLSI, 2022
  • IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2018,2019
  • IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2019
  • IEEE VLSI Test Symposium (VTS), 2017, 2018;
  • International Conference on VLSI Design (VLSID), 2018, 2019;
  • IEEE International Conference on Blockchain, 2018
  • IEEE North Atlantic Test Workshop (NATW), 2017.
Outreach Activities
HOST 2022 Microelectronics Security Challenge
Auburn E-Day Open House
UF/FICS Hardware De-obfuscation Competition
Engineering Summer Camps
GRAND Engineering Showcase