Vishwani D. Agrawal

James J. Danaher Professor of Electrical and Computer Engineering




Department of Electrical and Computer Engineering
Samuel Ginn College of Engineering
Auburn University
SPRING 2012 COURSES (with links to previous offerings):
ELEC5200-001/6200-001 Computer Architecture and Design, MWF 11AM, Broun 306
ELEC7770-001 Advanced VLSI Design, MWF 2PM, Broun 113
ELEC7950-001 VLSI Design and Test Seminar, by C. E. Stroud

OTHER COURSES (with links to previous offerings):
Fall 2011: ELEC2200-003 Digital Logic Circuits
Summer 2011: Low-Power Design of Digital VLSI Circuits, IIT, Delhi, July 26 - Aug 6, 2011
Spring 2011: ELEC5270-001/ELEC6270-001 Low-Power Design of Electronic Circuits
Fall 2010: ELEC5770-001/6770-001 Guest Lecture on Low Power VLSI Design, Nov. 16, 2010
Summer 2010: TSS@ETS'10 Fault Models, Fault Simulation and Test Generation, by Agrawal, Prague, May 22, 2010, Lectures 1, 2, 3, 4, 5
Spring 2010: ELEC7250-001, Guest Lectures on RF Testing, March 11, 2010 and April 28, 2009
Spring 2009: ELEC7250-001, VLSI Testing, ATE Classroom Exercise
Summer 2008: RFIC Design and Test Course at TI, Bangalore, India
Summer 2007: Low-Power Design and Test, Hyderabad, July 30-31, 2007
Spring 2006: ELEC7250-001 VLSI Testing
Fall 2004: ELEC7900, Independent Study of Computer Architectures, P. Sinha's Reports: Energy, Crossbar

RESEARCH:
NSF Test Infrastructure Project Overview Presentation, Jan 22, 2009.
Paper: Review of Carbon Nanotube Field Effect Transistors (58 pages), by Alokik Kanwal
Text-Book on Testing, Solution Manual (NOW AVAILABLE), Corrections, etc.
Talks and Papers
Doctoral, Master's and Honors Theses Supervised
Conference and Journal Announcements of General Interest
RESUME: Detailed (31 pages): ps pdf / Two-pages: doc / 500-words: text pdf doc IEEE Style (doc)
EDUCATION:
PhD, EE, 1971, University of Illinois at Urbana-Champaign, Urbana, Illinois, USA
ME, ECE, With Distinction, 1966, Indian Institute of Science, Bangalore, India
BE (Honours), Telecom. Eng., 1964, Indian Institute of Technology Roorkee (the oldest and the newest IIT), Roorkee, India
RESEARCH & PUBLICATIONS:
Recent talks and research papers
Books (5): Essentials of Electronic Testing . . . and others
Papers (250+) LATEX .bib file, postcript or pdf
Patents (13)
AWARDS:
2007: Honorable Mention Paper Award, VLSI Design'07 for Spectral Test Generation for Microprocessors, by Yogi and Agrawal
2006: Best Student Paper Award, IEEE-NATW06 for High-Level Test Generation for Gate-Level Fault Coverage, by Yogi and Agrawal
2006: Life-Time Achievement Award, International Conference on VLSI Design and VLSI Society of India
1998: Harry M. Goode Memorial Award
1996: Golden Core Charter Member, IEEE Computer Society
1993: Distinguished Alumnus Award, University of Illinois
See Pages 3 and 4 of Resume for a List of Awards
PROFESSIONAL:
Visiting Professor (1990-2003), Rutgers University, VLSI Testing Course, Spring 2002
Founder and Editor-in-Chief (1990-), JETTA-general, instructions for authors, cfp, etc., paper submission
Associate Editor (2003-08), IEEE Transactions on VLSI Systems
Editor-in-Chief (1985-87), IEEE Design & Test of Computers
Founder and Consulting Editor, Frontiers in Electronic Testing Book Series
Chairman, Steering Committee, VDAT Symposium and VLSI Design Conference
Board of Directors (1999-2005), Advisory Board (2005-), ECE Alumni Assoc., Univ. of Illinois at Urbana-Champaign
Member (2003-), EE Advisory Board, The City College of New York
Member (1997-2001), ECE Industrial Advisory Board, New Jersey Institute of Technology
Professional Societies: Fellow IETE, India (1983); Life Fellow IEEE (1986); Lifetime Fellow ACM (2002)
PERSONAL: Photo Album Prathima
ADDRESS: Vishwani D. Agrawal
Home:
774 Millers Point Road
Auburn, AL 36830, USA
vishwani02@yahoo.com
(334) 887-4390 (home), (908) 938-1219 (mobile)
Office:
Auburn University
Dept. of ECE, 200 Broun Hall
Auburn, AL 36849-5201, USA
vagrawal@eng.auburn.edu
(334) 844-1853 (voice), (334) 844-1809 (fax)
PAST AFFILIATIONS:
Thank you Visitor #
website-hit-counters.com
Last modified: Thu Jul 22, 2010, 14:47:30 EDT.