SUMMER 2010 IIT-D M.Tech. Course: VLSI Tseting
August 7-13, 2010
Course Syllabus
Instructor: Vishwani D. Agrawal, James J. Danaher Professor of ECE, Auburn University

Final Grades

Test 1, due in class on August 13, 2010.
Test 2, due in class on August 13, 2010

LECTURES (16):
Lecture 1: Introduction, Aug 7, 2010
Lecture 2: Yield and Quality, Aug 7, 2010
Lecture 3: Fault Modeling, Aug 9, 2010
Lecture 4: Testability Analysis, Aug 9, 2010
Lecture 5: Logic Simulation, Aug 9, 2010
Lecture 6: Fault Simulation, Aug 10, 2010
Lecture 7: Combinational ATPG, Aug 10, 2010
Lecture 8: Squential ATPG, Aug 10, 2010
Lecture 9: Delay Test, Aug 11, 2010
Lecture 10: Memory Test, Aug 11, 2010
Lecture11: Analog Test, Aug 11, 2010
Lecture 12: DFT and Scan, Aug 12, 2010
Lecture 13: BIST, Aug 12, 2010
Lecture 14: System Diagnosis, Aug 12, 2010
Lectures 15: RF Testing - Introduction and Gain Measurement, Aug 13, 2010
Lectures 16: RF Testing - Linearity and Noise Measurements, Aug 13, 2010

PREVIOUS OFFERINGS BY PROF. V. AGRAWAL:
Summer 2009 VLSI Testing, IIT Delhi, July 30 - Aug 13, 2009