Ujjwal Guin is currently an Assistant Professor at the Department of Electrical and Computer Engineering, Auburn University. He received his Ph.D. degree from University of Connecticut in 2016. He is actively involved in projects in the field of Hardware Security and Trust, Supply Chain Security, Cybersecurity, and VLSI Design and Test.
Prof. Guin has developed several on-chip structures and techniques to improve the security, trustworthiness, and reliability of integrated circuits. He is a recipient of the NSF CISE CRII Award 2018 for enabling trust in IC manufacturing. He has co-authored a book, Counterfeit Integrated Circuits: Detection and Avoidance. He has authored several journal articles and refereed conference papers. He is an active participant in the SAE International's G-19A Test Laboratory Standards Development Committee.
Prof. Guin have developed a web-based tool, Counterfeit Defect Coverage Tool (CDC Tool), http://www.sae.org/standardsdev/ cdctool/, to evaluate the effectiveness of different test methods used for counterfeit IC detection. SAE International has acquired this tool from University of Connecticut.
Last Updated: March 2018