Microelectronics Security Lab (MSL)

Prof. Guin has established the Microelectronics Security Lab (MSL) for developing secure systems and evaluating hardware-assisted security.

◾ Advantest T2000 VLSI Automatic Test Equipment

Advantest T2000 ATE is a flexible platform that addresses diverse test needs. The T2000 platform adopts a module architecture and can be flexibly reconfigured by rearranging the necessary functional modules according to the application. A rich variety of functional modules, including digital, high-performance analog, power-mixed signals, and image capture, provide a wide range of test coverage. More details can be found at the Advantest website.

◾ Riscure Inspector SCA

Inspector SCA – Side Channel Analysis – offers SPA, DPA, EMA, EMA-RF and RFA for embedded devices or Smart Cards. The user has detailed control over the entire side channel testing process. The Inspector architecture offers an open and flexible environment with an intuitive graphical representation of traces and analysis results. Furthermore, all aspects of side channel analysis are integrated in one solution, so that one does not need to switch between environments or workstations in order to perform different aspects of side channel testing.

◾ Riscure Inspector Inspector FI

Inspector FI – Fault Injection – offers all features to perform fault injection testing on embedded systems and smart card technology. Our hardware components cover accurate, reliable and thus predictable, clock and voltage glitching, and advanced optical attacks with purpose-built laser equipment. Fault injection attacks – also known as perturbation attacks – change the normal behaviour of a chip by inducing an exploitable fault. With Inspector FI, we can test if a key can be extracted by inducing faults in a chip’s cryptographic operations, bypass a check such as an authentication or a lifecycle state, or change the program flow of code on the chip.

◾ Theromostream ThermoSpot direct contact probe system

Theromostream ThermoSpot direct contact probe system is an industry-standard benchtop temperature cycling system, is used for thermal characterization of ICs. The device supports temperatures ranging from -65℃ to 175℃, with a transition rate of fewer than 35 seconds over 25℃ to -40℃. Therefore, the device can be used to study the effect of a wide range of temperature variations on the device performance and on accelerated aging degradation. This system are used for evaluating the reliability of electronics.

◾ MSO66B and MSO56B Mixed Signal Oscilloscopes

These are 6 and 5 Series Mixed Signal Oscilloscopes. They have 6 FlexChannels with 62.5M record length. MSO66B and MSO56B scopes are with 2.5 GHz and 350 MHz Bandwidths respectively.

◾ 2400 Graphical Series SMU

Keithley 2400 Graphical Series SMU instruments offer four-quadrant precision voltage and current source/load coupled with measurement now on an intuitive touchscreen user interface. These instruments can simultaneously source and measure current from 10 fA to 10 A pulse and/or voltage from 100 nV to 1100 V for 1000 W pulse and 100 W DC total power

◾ Benchtop Test Chamber

The Criterion temperature chamber provides an economical and space-saving solution for a variety of testing requirements. The specifications for the equipment is described as follows:

• Lowest temperature: -20 or -70°C (-4 or -94°F)
• Highest temperature: 180°C (354°F)
• Humidity range: 10 to 95% RH
• Chamber size: 1.5 cubic feet

See more details at https://espec.com/na/products/model/btz_133.