Technical Program Committee
- IEEE International Conference on Computer Design (ICCD), 2018; IEEE iSES, 2018; IEEE Cyber Science and Technology Congress (CyberSciTech), 2018; International Symposium on Devices, Circuits and Systems (ISDCS), 2018; IEEE North Atlantic Test Workshop (NATW), 2018.
- International Test Conference (ITC), 2017; International Conference On Computer Aided Design (ICCAD), 2017; Design Automation Conference (DAC), 2017; IEEE VLSI Test Symposium (VTS), 2017.
External Reader for PhD Thesis
- Yihua Luo, 2018, Adviser: Pradeep Lall, Title: Identification and Predictive Modeling of High Propensity of Defects and Field Failure in Copper-aluminum Wire Bond Interconnect under Exposure to High Temperature and Humidity.
- Uma Kannan, 2017, Adviser: David Umphress, Title: Cyber Security System Dynamic Modeling.
- IEEE Transactions on Industrial Informatics (TII);
IEEE Transactions on VLSI Systems (TVLSI);
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD);
Embedded Systems Letters;
Journal on Emerging Technologies in Computing Systems (JETC);
Journal of Electronic Testing: Theory and Applications (JETTA);
IEEE Design & Test;
Transactions on Computers (TC);
IEEE Transactions on Circuits and Systems (TCAS);
Journal of Hardware and Systems Security (HASS);
IEEE Transactions on Dependable and Secure Computing (TDSC);
IEEE Computer (COMSI); IEEE Transactions on Multi-Scale Computing Systems (TMSCS);
ACM Transactions on Design Automation of Electronic Systems (TODAES);
IET Computers & Digital Techniques;
Environment Systems and Decisions (ENVR);
Judge for Poster Sessions and Hardware Demos
- IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2017, 2018;
Hack@DAC at Design Automation Conference (DAC), 2017;
Graduate Engineering Research Showcase, Auburn University, 2016-2018.
- IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2018;
IEEE VLSI Test Symposium (VTS), 2017, 2018;
International Conference on VLSI Design (VLSID), 2018;
IEEE North Atlantic Test Workshop (NATW), 2017.
- IEEE Microprocessor Test and Verification (MTV) Conference, Austin, TX, Dec. 2017, Title:Mutual Authentication: A Robust Solution for Preventing System-Level Cloning.
- International Test Conference (ITC), Fort Worth, TX, Nov. 2017, Title: Efficient Strategies for Combating Die and IC Recycling.
- IEEE North Atlantic Test Workshop (NATW), Warwick, RI, Title: Efficient Strategies for Detection and Avoidance of Counterfeit ICs.
- Liaison of SAE G-19A Test Laboratory Standards Development Committee for developing aerospace standard AS6171 2015-Present
- Subgroup lead of AS6171/1: Suspect/Counterfeit Test Evaluation Method 2016-Present