Professional Activities and Service

Conference Organizing Committee

  • Audio/Video Chair, VLSI Test Symposym (VTS), 2019
  • Reverse Engineering Track Co-Chair, International Symposium for Testing and Failure Analysis (ISTFA), 2018

Technical Program Committee

  • IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2019
  • International Symposium on Consumer Technologies (ISCT), 2019
  • IEEE International Conference on Blockchain, 2019
  • ACM Great Lakes Symposium on VLSI (GLSVLSI), 2019
  • International Conference on VLSI Design (VLSID), 2019
  • IEEE International Conference on Computer Design (ICCD), 2018
  • IEEE Cyber Science and Technology Congress (CyberSciTech), 2018
  • International Symposium on Devices, Circuits and Systems (ISDCS), 2018
  • IEEE North Atlantic Test Workshop (NATW), 2018.

Editorial Activities

  • Guest Editor, IEEE Design & Test - SI:ITC2018

Groups

  • Liaison of SAE G-19A Test Laboratory Standards Development Committee for developing aerospace standard AS6171 2015-Present
  • Subgroup lead of AS6171/1: Suspect/Counterfeit Test Evaluation Method 2016-Present

Tutorials

  • Logic Locking: Current Trends, Attacks and Future Directions, International Conference on VLSI Design (VLSID), 2019

Invited Talks

  • IEEE Electronic Design Process Symposium (EDPS), Milpitas, CA, Sept. 2018, Title: Cybersecurity Solutions in Hardware.
  • IEEE Microprocessor Test and Verification (MTV) Conference, Austin, TX, Dec. 2017, Title:Mutual Authentication: A Robust Solution for Preventing System-Level Cloning.
  • International Test Conference (ITC), Fort Worth, TX, Nov. 2017, Title: Efficient Strategies for Combating Die and IC Recycling.
  • IEEE North Atlantic Test Workshop (NATW), Warwick, RI, Title: Efficient Strategies for Detection and Avoidance of Counterfeit ICs.

Session Chair

  • International Symposium for Testing and Failure Analysis (ISTFA), 2018
  • International Conference On Computer Aided Design (ICCAD), 2017-2018
  • International Test Conference (ITC), 2017-2018
  • IEEE International Conference on Blockchain, 2018
  • IEEE International Conference on Computer Design (ICCD), 2018
  • Design Automation Conference (DAC), 2017
  • IEEE VLSI Test Symposium (VTS), 2017

Reviewer for

  • IEEE Transactions on VLSI Systems (TVLSI), 2015-Present
  • Journal of Electronic Testing: Theory and Applications (JETTA), 2012-Present
  • IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2016-Present
  • IEEE Design & Test, 2014-2018
  • ACM Transactions on Design Automation of Electronic Systems (TODAES), 2014-Present
  • Journal of Hardware and Systems Security (HASS), 2016-Present
  • IEEE Transactions on Information Forensics & Security (TIFS), 2018
  • MDPI Cryptography, 2018
  • Integration, the VLSI Journal, 2018
  • Transactions on Multi-Scale Computing Systems, 2018
  • Future Generation Computer Systems, 2018
  • IEEE Transactions on Industrial Informatics (TII), 2018
  • Embedded Systems Letters, 2017
  • Journal on Emerging Technologies in Computing Systems (JETC), 2017
  • Transactions on Computers (TC), 2017
  • IEEE Transactions on Circuits and Systems (TCAS), 2017
  • IEEE Transactions on Dependable and Secure Computing (TDSC), 2016, 2017
  • IEEE Computer (COMSI), 2016
  • IEEE Transactions on Multi-Scale Computing Systems (TMSCS), 2015
  • IET Computers & Digital Techniques, 2014

Judge for Poster Sessions and Hardware Demos

  • IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2017-Present;
  • Graduate Engineering Research Showcase, Auburn University, 2016-Present.
  • Hack@DAC at Design Automation Conference (DAC), 2017;

Presentations

  • IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2018
  • IEEE VLSI Test Symposium (VTS), 2017, 2018;
  • International Conference on VLSI Design (VLSID), 2018, 2019;
  • IEEE International Conference on Blockchain, 2018
  • IEEE North Atlantic Test Workshop (NATW), 2017.
 Department of Electrical and Computer Engineering | Auburn University | Auburn, Alabama 36849-5201 | (334) 844-1835 | ujjwal.guin@auburn.edu
Website Feedback | Privacy | Copyright ©