Technical Program Committee

  • IEEE International Conference on Computer Design (ICCD), 2018; IEEE iSES, 2018; IEEE Cyber Science and Technology Congress (CyberSciTech), 2018; International Symposium on Devices, Circuits and Systems (ISDCS), 2018; IEEE North Atlantic Test Workshop (NATW), 2018.

Session Chair

  • International Test Conference (ITC), 2017; International Conference On Computer Aided Design (ICCAD), 2017; Design Automation Conference (DAC), 2017; IEEE VLSI Test Symposium (VTS), 2017.

External Reader for PhD Thesis

  • Yihua Luo, 2018, Adviser: Pradeep Lall, Title: Identification and Predictive Modeling of High Propensity of Defects and Field Failure in Copper-aluminum Wire Bond Interconnect under Exposure to High Temperature and Humidity.
  • Uma Kannan, 2017, Adviser: David Umphress, Title: Cyber Security System Dynamic Modeling.

Reviewer for

  • IEEE Transactions on Industrial Informatics (TII); IEEE Transactions on VLSI Systems (TVLSI); IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD); Embedded Systems Letters; Journal on Emerging Technologies in Computing Systems (JETC); Journal of Electronic Testing: Theory and Applications (JETTA); IEEE Design & Test; Transactions on Computers (TC); IEEE Transactions on Circuits and Systems (TCAS); Journal of Hardware and Systems Security (HASS); IEEE Transactions on Dependable and Secure Computing (TDSC); IEEE Computer (COMSI); IEEE Transactions on Multi-Scale Computing Systems (TMSCS); ACM Transactions on Design Automation of Electronic Systems (TODAES); IET Computers & Digital Techniques; Environment Systems and Decisions (ENVR); Microelectronics Journal.

Judge for Poster Sessions and Hardware Demos

  • IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2017, 2018; Hack@DAC at Design Automation Conference (DAC), 2017; Graduate Engineering Research Showcase, Auburn University, 2016-2018.


  • IEEE International Symposium on Hardware Oriented Security and Trust (HOST), 2018; IEEE VLSI Test Symposium (VTS), 2017, 2018; International Conference on VLSI Design (VLSID), 2018; IEEE North Atlantic Test Workshop (NATW), 2017.


Invited Talks

  • IEEE Microprocessor Test and Verification (MTV) Conference, Austin, TX, Dec. 2017, Title:Mutual Authentication: A Robust Solution for Preventing System-Level Cloning.
  • International Test Conference (ITC), Fort Worth, TX, Nov. 2017, Title: Efficient Strategies for Combating Die and IC Recycling.
  • IEEE North Atlantic Test Workshop (NATW), Warwick, RI, Title: Efficient Strategies for Detection and Avoidance of Counterfeit ICs.

Standard Development

  • Liaison of SAE G-19A Test Laboratory Standards Development Committee for developing aerospace standard AS6171 2015-Present
  • Subgroup lead of AS6171/1: Suspect/Counterfeit Test Evaluation Method 2016-Present
 Department of Electrical and Computer Engineering | Auburn University | Auburn, Alabama 36849-5201 | (334) 844-1835 |
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