Charles E. Stroud
Professor, IEEE Fellow
Dept. of
Electrical & Computer Engineering
200 Broun Hall
Phone:
(334)844-1806, FAX: (334)844-1809
Office: 325
Broun Hall
Course Materials
ELEC
2200 Digital Logic Circuits
ELEC
4200 Digital System Design
ELEC
5280/6280 Built-In Self-Test
Research
Topic Areas:
BIST for SoCs
BIST for Mixed-Signal Systems
BIST for FPGAs and CPLDs
BIST for Regular Structures
BIST for Digital VLSI &
ASICs
Other Design & Test
Topics
AUSIM Logic & Fault Simulator (also some other tools)
Publications
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