VLSI Design and Test Seminar "Functional Testing Using Advantest T2000GS" Praveen Venkataramani ECE Doctoral Candidate Wednesday, March 19, 2014 4:00 pm, 235 Broun Hall Abstract: Testing determines whether or not a circuit under test (CUT) operates correctly by comparing known output to the CUT response. Functional testing refers to a test procedure in which any functional or non-functional inputs may be applied to a CUT to observe its behavior. Automatic test equipment (ATE) provides tools to apply patterns, observe the response and evaluate the CUT for the specifications it has been designed. To perform these tests the user has to develop a test flow, known as test program, that tells the tester how a particular test needs to be run. Once the test program is developed the CUT can be tested under varying operating conditions. In this seminar we will go through the test programming flow to perform functional testing using Advantest T2000 tester with a simple example of a counter circuit to determine the minimum voltage and maximum frequency of operation.