Vishwani D. Agrawal is a Professor Emeritus at Auburn University, Alabama, USA, where prior to retiring in September 2016 he was the James J. Danaher Professor of Electrical and Computer Engineering. He has over forty years of industry and university experience, working at Bell Labs, Murray Hill, NJ; Rutgers University, New Brunswick, NJ; TRW, Redondo Beach, CA; IIT, Delhi, India; EG&G, Albuquerque, NM; and ATI, Champaign, IL. His areas of work include VLSI testing, low-power design, and microwave antennas. He obtained his BE degree from the University of Roorkee (renamed Indian Institute of Technology), Roorkee, India, in 1964; ME degree from the Indian Institute of Science, Bangalore, India, in 1966; and PhD degree in electrical engineering from the University of Illinois, Urbana-Champaign, in 1971. He has published over 400 papers, has coauthored five books and holds thirteen United States patents. His textbook, Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits, co-authored with M. L. Bushnell, was published in 2000. He is the founder and Editor-in-Chief (since 1990) of the Journal of Electronic Testing: Theory and Applications, a past Editor-in-Chief (1985-87) of the IEEE Design & Test of Computers magazine and a past Editorial Board Member (2003-08) of the IEEE Transactions on VLSI Systems. He is the Founder and Consulting Editor of the Frontiers in Electronic Testing Book Series of Springer. He is a co-founder and the Steering Committee Chair of the International Conference on VLSI Design and the VLSI Design and Test Symposium, held annually in India. He was the invited Plenary Speaker at the 1998 International Test Conference, Washington D.C., and the Keynote Speaker at the Ninth Asian Test Symposium, held in Taiwan in December 2000. During 1989 and 1990, he served on the Board of Governors of the IEEE Computer Society, and in 1994, chaired the Fellow Selection Committee of that Society. He has received ten Best Paper Awards and two Honorable Mention Paper Awards. He is the recipient of the 2014 James Monzel Award from the IEEE North Atlantic Test Workshop and the 2012 Lifetime Contribution Medal from the Test Technology Technical Council of the IEEE Computer Society. Previously, he received the 2006 Lifetime Achievement Award of the VLSI Society of India, in recognition of his contributions to the area of VLSI Test and for founding and steering the International Conference on VLSI Design in India. In 1998, he received the Harry H. Goode Memorial Award of the IEEE Computer Society, for innovative contributions to the field of electronic testing, and in 1993, received the Distinguished Alumnus Award of the University of Illinois at Urbana-Champaign, in recognition of his outstanding contributions in design and test of VLSI systems. Most recently in 2019, he received another Distinguished Alumnus Award from the Indian Institute of Technology, Roorkee, in the category of academic excellence. Dr. Agrawal is a Fellow of the IETE-India (since 1983), a Fellow of the IEEE (since 1986, now a Life Fellow) and a Fellow of the ACM (since 2002). He has served on the advisory boards of the ECE Departments at University of Illinois, New Jersey Institute of Technology, and the City College of the City University of New York. See his website http://www.eng.auburn.edu/~vagrawal (11/25/19)