Two-Day Seminar on Testing Analog and Digital Products
Penang, Malaysia, July 12-13, 2005
Course Syllabus
Instructor: Vishwani D. Agrawal, James J. Danaher Professor of ECE, Auburn University

Lecture 1: Introduction, July 12, 2005
Lecture 2: Yield and Quality, July 12, 2005
Lecture 3: Fault Modeling, July 12, 2005
Lecture 4a: Logic Simulation, July 12, 2005
Lecture 4b: Fault Simulation, July 12, 2005
Lecture 5: Testability Measures, July 12, 2005
Lecture 6: Combinational ATPG, July 12, 2005

Test 1, Solution

Lecture 7: Sequential ATPG, July 13, 2005
Lecture 8: Memory Test, July 13, 2005
Lecture 9: Analog Test, July 13, 2005
Lecture 10: DFT and Scan, July 13, 2005
Lecture11: BIST, July 13, 2005
Lecture 12: System Diagnosis, July 13, 2005

Test 2, Solution