ELEC 7250 (Spring 2004): Term Paper Assignments

Assigned 04-13-04, Due 04-27-04

INSTRUCTIONS Chimakurthy: Stuck-at faults [215] Paper
Dixit: Fault coverage by random sampling Paper
Doshi: Subscripted D algorithm Paper
Garimella: Redundant faults Paper
George: Switch-level simulation [103,105] Paper
Ghosh: STAFAN [335] Paper
Gore: TEST-DETECT [551] Paper
Gottiparthy: PROOFS [496] Paper
Harris: PARIS [267,375] Paper
Kannan: Microprocessor testing [660] Paper
Kopalle: Verification testing [447]
Liu: ATPG by fault sampling [591] Paper
Lu: Fault collapsing Paper
Mathur: TOPS
Mudlapur: Spectral testing Paper
Newalkar: VICTOR [536] Paper
Paruchuri: Independent faults Paper
Ramkumar: Analog test bus standard Paper
Sandireddy: Independent faults [45]
Shetye: Transition delay faults Paper
Sunwoo: IDDQ testing Paper
Tadiparti: Memory BIST Paper
Tang: Boundary scan standard Paper
Varadharajaperumal: PODEM Paper
Vippa: Path-delay testing Paper
Xu: Defect-level and fault coverage Paper