CORRECTIONS TO THE 2006 SPRINGER PRINTING OF THE BOOK Essentials of Electronic Testing . . . by M. L. Bushnell and V. D. Agrawal (Note: These corrections are also applicable to all previous printings) Updated Sep. 20, 2007 Page 138 Sixth line from the bottom, should read as (Ravi Kumar Kodela): "According to Figure 6.3, for a three-input NOR gate:" Page 400 Figure 11.7, an edge should be added between fc2 and R5. Page 633 Reference [43], page numbers should read "509-516" instead of "66-73". ---------------------------------------------------------------------------- CORRECTIONS TO THE 2005 SPRINGER PRINTING (Note: Following corrections have been included in 2006 and later Springer printings) Page 76 In Table 4.3, the row for s9234 should read as follows (R. K. K. Sandireddy): | 9234 | 5,597 | 19 | 22 | 18,468 | 6,927 | 0.38 | ---------------------------------------------------------------------------- CORRECTIONS TO THE FIRST (2000) AND SECOND (2001) KLUWER PRINTINGS (Note: Following corrections have been included in 2005 and later Springer printings) Page 46 First equation on the page, on the right hand side first replace "x" by another variable "y" and then replace "n" by "x" (Sharad Seth). Page 50 Section 3.3.2, para 1, last line, "0.45 micron" should read "0.8 micron". Page 55 The statement of Problem 3.3(a) should read: Show that this scheme is beneficial for chips whose total cost is less than ten times the burn-in cost when the burn-in yield is 90%. Page 76 Add the following row to Table 4.3, between c5215 and c7552: | c6288 | 2,416 | 32 | 32 | 12,576 | 7,744 | 0.62 | For c7552, the No. of gates should read 3,512, and not 3,513 Source - http://www.cbl.ncsu.edu/CBL_Docs/Bench.html (some numbers of collapsed faults may differ due to modeling variations.) Page 78 Definition 4.7 should read: "Checkpoints. Primary inputs and fanout branches of a combinational circuit consisting only of Boolean gates are called the checkpoints." Page 85 Example 5.2, sixth line from the end of the page, "...three outputs S1 and C1..." should read "...both outputs S1 and C2..." (Rakesh Modi, Rutgers). Page 95 Figure 5.6, pMOS and nMOS transistors should be interchanged in the NOR gate. Page 115 Tenth line from the bottom, "g0" should read "g1" (Dan Mazor, Rutgers). Page 189 Fourth line below the table, "...to a 0 to" should read "...to a 1 to" Last line, "r=1" should read "r=0" (Jeff Nelson, Rutgers, and L. N. Balasubramanian (LNB), Intel) First Para, last line, "r=0" should read "r=1" (Raja Sandireddy, Auburn). Page 191 First paragraph, last sentence, "...fault s sa0..." should read "...fault s sa1..." (Ayoush Dixit, Auburn). Page 236 Figure 8.19, second output label should read "PO k" instead of "PI k" (LNB, Intel). Page 251 Problem 8.12, "three times" should read "four times" "sequential depth" should read "sequential depth + 1". Problem 8.13, "sequential depth" should read "sequential depth + 1" Page 271 Third paragraph, "Mealy machine" should read "Moore machine" (J. Patel). Page 302 Figure 9.34, inputs to column address buffer should read "A6....A11" instead of "A0....A11" (LNB, Intel). Page 365 Table 10.8, last but one row: "A-law CODEC encoding" to read as "A-law CODEC decoding". Page 486 Problem 14.5 should read: Modulo-5 counter. To repeat Example 14.1 design a modulo-5 counter circuit that counts from 0 to 4 and then resets to 0. A single output becomes 1 only when the count is 4. Using an ATPG program make the combinational logic irredundant and then find any untestable faults in the sequential circuit. Page 531 Figure 15.38(a), flip-flop labels should read (l to r) x^2, x and 1. Figure 15.38(b), flip-flop labels should read (l to r) 1, x and x^2. Line 6, characteristic polynomial should read G(x) = x^3 + x^2 + 1. Line 8, characteristic polynomial should read G(x) = x^3 + x + 1. Page 544 Problem 15.1, add "Hint: See the paper by Wagner et al. [702]." Page 545 Problem 15.14, "...is repeated twice." should read "...is applied twice." (Nilmoni Deb, CMU). Page 573 Problem 16.9, in table Address should have 28 bits instead of 26 shown. Page 612 Table 18.5, the number of gates for c6288 should read 2416, and not 2406. ------------------------------------------------------------------------- CORRECTIONS TO THE FIRST KLUWER PRINTING (YEAR 2000) (Note: Following corrections have been included in the 2001 and later printings) p. 33 Fig. 2.10, interchange labels "Clock Waveform" and "Input Waveform". (pointed out be Mike Balster and Gordon Robinson of Credence Systems Corp., Fremont, CA.) p. 34 Problems 2.3 and 2.5, "...(for all 6 flip-flops), 6 D lines, 6 Q lines," should read, "...(for all 5 flip-flops), 5 D lines, 5 Q lines," p. 53 Paragraph 3, "238,500" should read "237,700". p. 54 Problem 3.1, line 2, "Equation 3.2" should read "a relation similar to Equation 3.2". p. 55 Problem 3.3, part (a), line 2, "81%" should read "about ten times". p. 70 Transition Fault, last line, delete repeated phrase, "Also see Chapter 12", appearing as a separate paragraph. p. 73 Figure 4.7, OR gate, upper and lower collapsing arrows should point to sa1, and not to sa0 faults. Section 4.5.2, line 3, "2n^2 -n pairs" should read "2(n^2 -n) pairs". p. 117 Example 5.12, line 5, "even-driven" should read "event-driven". p. 122 Eqs. 5.2 and 5.3, r.h.s, "CNs" should read "CNp". p. 159 Figure 7.2(b), leaf-node labels should read, left to right: 0 1 1 0 1 0 0 1 p. 168 Figure 7.8, the caption of part (b) should read: "(b) Redundant hardware from testing definition." p. 181 Add after line 9, insert a line with same indentation as "Add the...", "Find all forward and backward implications of the new signal assignment;" Last line should read as follows: "the inputs to the singular cover to g, find all forward and backward implications of the new signal assignment, and break;" p. 184 Example 7.3, line 6, "three backtracks" should read "one backtrack". p. 185 Fig. 7.22, add or change controllability labels of following lines: s (8,8); v (10,10); Y (14,6); Z (16,2). p. 189 Table 7.14, row #18: X=1 should read X=0, and "v=D(bar)" should be added to the list. p. 191 First para, last line should read XYZ="0 Dbar X" and not XYZ="1 Dbar X" p. 198 Line 12, ".., but necessary,.." should read ".., but not necessary,.." (Shuo Sheng) p. 221 Figure 8.7, Controllabilities on the upper input of gate A should read (4,4), instead of (4,2). p. 228 Figure 8.11, in time-frame -3, signals D and Z''' should be X, and not 1. p. 347 Equations 10.24 and 10.25, the range of summation should be "I=1 to N". p. 368 Equation 10.39, the ratio on the right hand side should be "V2/V1". p. 405 Fig. 11.8, following edge labels should change: (fc1,R3) 14.81; (fc1,C1) 15.2; (fc2,C2) 13.96. p. 410 Fig. 11.12, label "CALCULATED SPICE INPUT" should read "ACTUAL SPICE OUTPUT". p. 412 Eq. 11.41, last line, r.h.s. should read |goodval(R1) - badval(R1)|. p. 421 Fig. 12.3, d(P), d(Q) and d(R) should read d(P1), d(P2) and d(P3), respectively. Also, a legend "d(x)=delay of path x or gate x" is missing. p. 426 Para 3, line 2, last word, "signly" should read "singly". (S. Sheng) p. 433 Bullets 2 and 3, eighth word, "that" should read "than". p. 444 Lines 8-9, "when V_in is 5V,..." should read "when V_IN is 0V,..." p. 468 Last para, line 7, the sentence, "The MC inputs..." should read, "The TCK (or TC for the single-clock flip-flop of Figure 14.2) inputs..." p. 473 Equation 14.1 should read (Xiao Liu): Scan test length = n_sff + 4 + (n_sff + 1) n_comb + n_sff = (n_comb + 2) n_sff + n_comb + 4 (14.1) Line above Example 14.1, "1,006,004" should read "1,004,504". p. 474 Line 13, "34 vectors" should read "44 vectors". Last para, line 1 should read: "... ng gates and nff flip-flops, each consisting of ten gates." Equation 14.2 should read: 4 x nsff Gate overhead of scan = -------- x 100% (14.2) ng+10nff p. 475 Line 3, "8%" should be changed to "6.7%". p. 482 Table 14.1, Gate overhead row entries should be 0.0%; 15.66%; 2.63%. Last row (Test seq) entries should be 414; 105,662; 34,691. p. 486 Problem 14.2 should read: MUX design. Design an economical CMOS circuit for a static two-to-one multiplexer. Problem 14.5, line 1, "five-bit" should read "modulo-5". p. 487 Problem 14.6, line 1, "modulo-3" should read "modulo-5". p. 494 Line 14, "6,887,200" should read "4,487,200". p. 504 Equation 15.1, last row on right hand side, subscript "h-2" should read "n-2". p. 515 Figure 15.19, table column headings, superscripts 0 through 4 for "X" should be shown as subscripts. fifth term in the expression, "+.x^4" should be "+0.x^4". p. 517 Equation 15.15, last row on right hand side, subscript "h-2" should read "n-2". p. 522 Second line from the bottom, "20" should read "200". p. 528 Figure 15.37, subscripted labels "g1" and "h1" should read as subscripted labels "gt" and "ht", respectively. p. 529 Example 15.12, subscripted variables "c1" and "c2" should read as subscripted variables "C1" and "C2", respectively. Similarly, ... during phases phi_0 and phi_1, ... During phi_2 and phi_3, ... p. 538 Paragraph under Equation 15.20, lines 5 and 6, two sentences "C1(R) counts . . . 1->0 transitions." should be replaced by "C1(R) counts the number of 1s. C2(R) counts the number of 0->1 transitions. C3(R) counts both 0->1 and 1->0 transitions." p. 572 Problem 16.3, data about Chip 4 should read, 500,000 test patterns and 512 pins. p. 577 Figure 17.1, Two ABM blocks in the left schematic, input G should read V . G p. 581 Table 17.2, column labeled "9", first row entry should read 1 instead of 0. p. 614 Fourth bullet, "MEM" should read "MEMS". p. 615 Preliminaries. Line 2-3, correct sentence: "As an example, 10111 is written as x^4 + x^2 + x + 1." p. 616 Step-wise division, in the remainder after the first subtraction, include a term "+1". The remainder is x^4 + x^3 + x + 1.