@book{tehranipoor2015counterfeit,
  title="{Counterfeit Integrated Circuits: Detection and Avoidance}",
  author={Tehranipoor, M. and Guin, U. and Forte, D.},
  isbn={9783319118246},
  year={2015},
  publisher={Springer International Publishing}
}

 @article{cui2021trillion,
  title="{Trillion Sensors Security}",
  author={Cui, Pinchen and Guin, Ujjwal and Tehranipoor, Mark},
  journal={Emerging Topics in Hardware Security},
  year={2021},
  pages={61--91},
  publisher={Springer Nature}
}

@incollection{guin2017obfuscation,
  title="{Obfuscation and encryption for securing semiconductor supply chain}",
  author={Guin, Ujjwal and Tehranipoor, Mark M},
  booktitle={Hardware Protection through Obfuscation},
  pages={317--346},
  year={2017},
  publisher={Springer}
}

@misc{tehranipoor2017comprehensive,
  title="{A comprehensive framework for protecting intellectual property in the semiconductor industry}",
  author={Tehranipoor, Mark M and Forte, Domenic J and Ujjwal, Guin},
  year={2017},
  publisher={Google Patents}
  }

%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% Journal Papers %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%

@article{zhong2023comprehensive,
  title="{A Comprehensive Test Pattern Generation Approach Exploiting SAT Attack for Logic Locking}",
  author={Zhong, Yadi and Guin, Ujjwal},
  journal={IEEE Transactions on Computers},
  year={2023}
}

@article{zhong2023complexity,
  title="{Complexity Analysis of the SAT Attack on Logic Locking}",
  author={Zhong, Yadi and Guin, Ujjwal},
  journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits (TCAD)},
  pages={1--13},
  year={2023}
}

@article{zhong2022afia,
  title={AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking},
  author={Zhong, Yadi and Jain, Ayush and Rahman, M Tanjidur and Asadizanjani, Navid and Xie, Jiafeng and Guin, Ujjwal},
  journal={Journal of Electronic Testing},
  volume={38},
  number={5},
  pages={527--546},
  year={2022},
  publisher={Springer}
}

@article{wang2022systematic,
  title={A Systematic Bit Selection Method for Robust SRAM PUFs},
  author={Wang, Wendong and Singh, Adit D and Guin, Ujjwal},
  journal={Journal of Electronic Testing},
  pages={1--12},
  year={2022},
  publisher={Springer}
}

@article{lucas2022lightweight,
  title="{Lightweight Hardware Implementation of Binary Ring-LWE PQC Accelerator}",
  author={Lucas, Benjamin J and Alwan, Ali and Murzello, Marion and Tu, Yazheng and He, Pengzhou and Schwartz, Andrew J and Guevara, David and Guin, Ujjwal and Juretus, Kyle and Xie, Jiafeng},
  journal={IEEE Computer Architecture Letters},
  pages={17--20},
  year={2022},
  publisher={IEEE}
}

@article{collier2021decision,
  title="{Decision model with quantification of buyer-supplier trust in advanced technology enterprises}",
  author={Collier, Zachary A and Guin, Ujjwal and Sarkis, Joseph and Lambert, James H},
  journal={Benchmarking: An International Journal},
  year={2021},
  publisher={Emerald Publishing Limited}
}

@article{tang2021effects,
  title="{Effects of Temperature and Structural Geometries on a Skyrmion Logic Gate}",
  author={Tang, Chunli and Alahmed, Laith and Xu, Jihao and Shen, Maokang and Jones, Nicholas Alex and Sadi, Mehdi and Guin, Ujjwal and Zhao, Wenfeng and Li, Peng},
  journal={IEEE Transactions on Electron Devices},
  pages={1706--1712},
  year={2021},
  publisher={IEEE}
}

@article{collier2021zero,
  title="{Zero Trust for Hardware Supply Chains: Challenges in Application of Zero Trust Principles to Hardware}",
  author="{D. DiMase, Z. A. Collier, J. Muldavin, J. A. Chandy, D. Davidson, D. Doran, U. Guin, J. Hallman, J. Heebink, E. Hall, Honorable A. R. Shaffer}",
  journal={National Defense Industrial Association (NDIA)},
  year={2021},
}

@article{he2021novel,
  title="{Novel Low-Complexity Polynomial Multiplication Over Hybrid Fields for Efficient Implementation of Binary Ring-LWE Post-Quantum Cryptography}",
  author={He, Pengzhou and Guin, Ujjwal and Xie, Jiafeng},
  journal={IEEE Journal on Emerging and Selected Topics in Circuits and Systems},
  volume={11},
  number={2},
  pages={383--394},
  year={2021}
}

@article{sadi2021test,
  title="{Test and Yield Loss Reduction of AI and Deep Learning Accelerators}",
  author={Sadi, Mehdi and Guin, Ujjwal},
  journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems},
  volume={41},
  number={1},
  pages={104--115},
  year={2021},
  publisher={IEEE}
}

@article{chowdhury2021estimating,
    title="{Estimating Operational Age of an Integrated Circuit}",
    author={Chowdhury, Prattay and Guin, Ujjwal and Singh, Adit D and  Agrawal,   Vishwani D},
    journal={Journal of Electronic Testing},
    pages={1--16},
    year={2021},
    publisher={Springer}
} 

@article{jain2021taal,
  title="{TAAL: Tampering Attack on Any Key-based Logic Locked Circuits}",
  author={Jain, Ayush and Zhou, Ziqi and Guin, Ujjwal},
  journal={ACM Transactions on Design Automation of Electronic Systems (TODAES)},
  volume={26},
  number={4},
  pages={1--22},
  year={2021}
}

 @article{zhang2020novel,
  title="{A novel topology-guided attack and its countermeasure towards secure logic locking}",
  author={Zhang, Yuqiao and Jain, Ayush and Cui, Pinchen and Zhou, Ziqi and Guin, Ujjwal},
  journal={Journal of Cryptographic Engineering},
  pages={1--14},
  year={2020},
  publisher={Springer}
}

@article{wang2020aging,
  title="{Aging-Resilient SRAM-based True Random Number Generator for Lightweight Devices}",
  author={Wang, Wendong and Guin, Ujjwal and Singh, Adit},
  journal={Journal of Electronic Testing},
  volume={36},
  pages={301--311},
  year={2020},
  publisher={Springer}
}

@article{mahmod2020robust,
  title="{A Robust, Low-Cost and Secure Authentication Scheme for IoT Applications}",
  author={Mahmod, Md Jubayer al and Guin, Ujjwal},
  journal={Cryptography},
  volume={4},
  number={1},
  pages={8},
  year={2020},
  publisher={Multidisciplinary Digital Publishing Institute}
}

@article{cui2019blockchainProvenance,
  title="{A blockchain-based framework for supply chain provenance}",
  author={Cui, Pinchen and Dixon, Julie and Guin, Ujjwal and DiMase, Daniel},
  journal={IEEE Access},
  volume={7},
  pages={157113--157125},
  year={2019}
}

@article{cui2019blockchainSurvey,
  title="{Blockchain in IoT: Current Trends, Challenges, and Future Roadmap}",
  author={Cui, Pinchen and Guin, Ujjwal and Skjellum, Anthony and Umphress, David},
  journal={Journal of Hardware and Systems Security},
  volume={3},
  number={4},
  pages={338--364},
  year={2019},
  publisher={Springer}
}

@article{zhang2019end,
  title="{End-to-End Traceability of ICs in Component Supply Chain for Fighting Against Recycling}",
  author={Zhang, Yuqiao and Guin, Ujjwal},
  journal={IEEE Transactions on Information Forensics and Security},
  volume={15},
  pages={767--775},
  year={2019}
}

@article{guin2019standards,
  title="{Standards for hardware security}",
  author={Guin, Ujjwal and Asadizanjani, Navid and Tehranipoor, Mark},
  journal={GetMobile: Mobile Computing and Communications},
  volume={23},
  number={1},
  pages={5--9},
  year={2019}
}

  @article{cyr2019low,
  title="{Low-Cost and Secure Firmware Obfuscation Method for Protecting Electronic Systems from Cloning}",
  author={Cyr, Benjamin and Mahmod, Jubayer and Guin, Ujjwal},
  journal={IEEE Internet of Things Journal},
  volume={6},
  number={2},
  pages={3700--3711},
  year={2019}
}

@inproceedings{wang2018iotcp,
  title="{IoTCP: A Novel Trusted Computing Protocol for IoT}",
  author={Wang, Paul and Ali, A and Guin, U and Skjellum, A},
  booktitle={The Colloquium of Information Systems Security Education (CISSE)},
  pages={165--180},
  year={2018}
}

@article{guin2018robust,
  title="{Robust Design-for-Security Architecture for Enabling Trust in IC Manufacturing and Test}",
  author={Guin, Ujjwal and Zhou, Ziqi and Singh, Adit},
  journal={IEEE Transactions on Very Large Scale Integration (VLSI) Systems},
  volume={26},
  number={5},
  pages={818--830},
  year={2018}
}

  @article{alam2017tsensors,
  title="{Tsensors Vision, Infrastructure and Security Challenges in Trillion Sensor Era}",
  author={Alam, Mahabubul and Tehranipoor, Mark M and Guin, Ujjwal},
  journal={Journal of Hardware and Systems Security},
  volume={1},
  number={4},
  pages={311--327},
  year={2017}
}

@article{tehranipoor2017invasion,
  title={Invasion of the Hardware Snatchers},
  author={Tehranipoor, Mark M and Guin, Ujjwal and Bhunia, Swarup},
  journal={IEEE Spectrum},
  volume={54},
  number={5},
  pages={36--41},
  year={2017}  
}

@article{guin2016sma,
  title="{SMA: A System-Level Mutual Authentication for Protecting Electronic Hardware and Firmware}",
  author={Guin, Ujjwal and Bhunia, Swarup and Forte, Domenic and Tehranipoor, Mark M},
  journal={IEEE Transactions on Dependable and Secure Computing},
  volume={14},
  number={3},
  pages={265--278},
  year={2016}
}

@article{guin2016fortis,
  title="{FORTIS: A Comprehensive Solution for Establishing Forward Trust for Protecting IPs and ICs}",
  author={Guin, Ujjwal and Shi, Qihang and Forte, Domenic and Tehranipoor, Mark M},
  journal={ACM Transactions on Design Automation of Electronic Systems (TODAES)},
  volume={21},
  number={4},
  pages={1--20},
  year={2016}
}

@article{guin2015design,
  title="{Design of Accurate Low-Cost On-Chip Structures for Protecting Integrated Circuits Against Recycling}",
  author={Guin, Ujjwal and Forte, Domenic and Tehranipoor, Mark},
  journal={IEEE Transactions on Very Large Scale Integration (VLSI) Systems},
  volume={24},
  number={4},
  pages={1233--1246},
  year={2015}
}

@article{guin2014counterfeitProc,
  title="{Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain}",
  author={Guin, Ujjwal and Huang, Ke and DiMase, Daniel and Carulli, John M and Tehranipoor, Mohammad and Makris, Yiorgos},
  journal={Proceedings of the IEEE},
  volume={102},
  number={8},
  pages={1207--1228},
  year={2014}
}

@article{guin2014counterfeitJETTA,
  title="{Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead}",
  author={Guin, Ujjwal and DiMase, Daniel and Tehranipoor, Mohammad},
  journal={Journal of Electronic Testing},
  volume={30},
  number={1},
  pages={9--23},
  year={2014}
}

@article{guin2014comprehensive,
  title="{A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment}",
  author={Guin, Ujjwal and DiMase, Daniel and Tehranipoor, Mohammad},
  journal={Journal of Electronic Testing},
  volume={30},
  number={1},
  pages={25--40},
  year={2014}
}

%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%% Conference Papers %%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%
%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%%

@inproceedings{odom2024novel,
  title="{A Novel Self-referencing Approach Using Memory Power-up States for Detecting COTS SRAMs}",
  author={Odom, Gaines and Tisha, Zakia Tamanna and Guin, Ujjwal},
  booktitle={VLSI Test Symposium (VTS)},
  pages={1--7},
  year={2024}
}

@inproceedings{guin2024blockchain,
  title="{Blockchain-enabled Whitelisting for securing 3D ICs}",
  author={Guin, Ujjwal and Krishnamachari, Bhaskar},
  booktitle={GOMACTech},
  pages={1--4},
  year={2024}
}

@inproceedings{odom2024self,
  title="{Self-Referencing Electrical Tests using SRAM Power-up States for Detecting Recycled ICs}",
  author={Odom, Gaines and Tisha, Zakia Tamanna and Guin, Ujjwal},
  booktitle={GOMACTech},
  pages={1--6},
  year={2024}
}

@inproceedings{zhong2023blockchain,
  title={A Modular Blockchain Framework for Enabling Supply Chain Provenance},
  author={Zhong, Yadi and Ebrahim, Amaar and Guin, Ujjwal and Menon, Vivek},
  booktitle={IEEE Physical Assurance and Inspection of Electronics (PAINE)},
  pages={1--7},
  year={2023}
}

@inproceedings{zhong2023ondemand,
  title={On-Demand Device Authentication using Zero-Knowledge Proofs for Smart Systems},
  author={Zhong, Yadi and Hovanes, Joshua and Guin, Ujjwal},
  booktitle={Proceedings of the Great Lakes Symposium on VLSI (GLSVLSI)},
  pages={1--6},
  year={2023}
}

@inproceedings{hovanes2022beware,
  title="{Beware of Discarding Used SRAMs: Information is Stored Permanently}",
  author={Hovanes, Joshua and Zhong, Yadi and Guin, Ujjwal},
  booktitle={IEEE Physical Assurance and Inspection of Electronics (PAINE)},
  pages={1--7},
  year={2022},
}


@inproceedings{zhong2022chosen,
  title={Chosen-Plaintext Attack on Energy-Efficient Hardware Implementation of GIFT-COFB},
  author={Zhong, Yadi and Guin, Ujjwal},
  booktitle={IEEE International Symposium on Hardware Oriented Security and Trust (HOST)},
  pages={73--76},
  year={2022},
  organization={IEEE}
}

@inproceedings{zhang2022camskygate,
  title={CamSkyGate: camouflaged skyrmion gates for protecting ICs},
  author={Zhang, Yuqiao and Tang, Chunli and Li, Peng and Guin, Ujjwal},
  booktitle={Proceedings of the 59th ACM/IEEE Design Automation Conference},
  pages={757--762},
  year={2022}
}

@inproceedings{zhong2022fault,
  title={Fault-Injection Based Chosen-Plaintext Attacks on Multicycle AES Implementations},
  author={Zhong, Yadi and Guin, Ujjwal},
  booktitle={Proceedings of the Great Lakes Symposium on VLSI (GLSVLSI)},
  pages={443--448},
  year={2022}
}

@inproceedings{zhong2022chosen,
  title="{Chosen-Plaintext Attack on Energy-Efficient Hardware Implementation of GIFT-COFB}",
  author={Zhong, Yadi and Guin, Ujjwal},
  booktitle={IEEE International Symposium on Hardware Oriented Security and Trust (HOST)},
  pages={1--4},
  year={2022}
}

@inproceedings{zhang2022camouflaging,
  title="{CamSkyGate: Camouflaged Skyrmion Gates for Protecting ICs}",
  author={Y. Zhang and C. Tang and Li, Peng and Guin, Ujjwal},
  booktitle={Design Automation Conference (DAC)},
  pages={1--6},
  year={2022}
}

@inproceedings{zhou2022fault,
  title={Fault Modeling and Test Generation for Technology-Specific Defects of Skyrmion Logic Circuits},
  author={Zhou, Ziqi and Guin, Ujjwal and Li, Peng and Agrawal, Vishwani D},
  booktitle={2022 IEEE 40th VLSI Test Symposium (VTS)},
  pages={1--7},
  year={2022},
  organization={IEEE}
}

@inproceedings{sadi2022low,
  title="{Low Power, Rad-Hard, and Secure Polymorphic and Neuromorphic Designs using Skyrmions}",
  author={Sadi, Mehdi and Li, Pend and Guin, Ujjwal and Walters, S. and DiMase, Daniel},
  booktitle={GOMACTech},
  pages={1--4},
  year={2022}
}

@inproceedings{mittal2021blockchain,
  title="{A Blockchain-based Contactless Delivery System for Addressing COVID-19 and Other Pandemics}",
  author={Mittal, Pratiksha and Walthall, Austin and Cui, Pinchen and Skjellum, Anthony and Guin, Ujjwal},
  booktitle={2021 IEEE International Conference on Blockchain (Blockchain)},
  pages={1--6},
  year={2021},
  organization={IEEE}
}

@inproceedings{zhou2021defect,
  title="{Defect Characterization and Testing of Skyrmion-Based Logic Circuits}",
  author={Zhou, Ziqi and Guin, Ujjwal and Li, Peng and Agrawal, Vishwani D},
  booktitle={VLSI Test Symposium (VTS)},
  pages={1--7},
  year={2021}
}

@inproceedings{kundu2021special,
  title="{Special Session: Reliability Analysis for AI/ML Hardware}",
  author={Kundu, Shamik and Basu, Kanad and Sadi, Mehdi and Titirsha, Twisha and Song, Shihao and Das, Anup and Guin, Ujjwal},
  booktitle={VLSI Test Symposium (VTS)},
  pages={1--10},
  year={2021}
}

 @inproceedings{jain2021survey,
  title="{Survey of Recent Developments for Hardware Trojan Detection}",
  author={Jain, Ayush and Zhou, Ziqi and Guin, Ujjwal},
  booktitle={IEEE International Symposium on Circuits and Systems (ISCAS)},
  pages={1--5},
  year={2021}
  
}

@inproceedings{jain2020novel,
  title="{A Novel Tampering Attack on AES Cores with Hardware Trojans}",
  author={Jain, Ayush and Guin, Ujjwal},
  booktitle={IEEE International Test Conference in Asia (ITC-Asia)},
  pages={77--82},
  year={2020}
}

@inproceedings{jain2020atpg,
  title="{ATPG-Guided Fault Injection Attacks on Logic Locking}",
  author={Jain, Ayush and Rahman, M Tanjidur and Guin, Ujjwal},
  booktitle={IEEE Physical Assurance and Inspection of Electronics (PAINE)},
  pages={1--6},
  year={2020}
}

@inproceedings{stern2020sparta,
  title="{SPARTA-COTS: A Laser Probing Approach for Sequential Trojan Detection in COTS Integrated Circuits}",
  author={Stern, Andrew and Mehta, Dhwani and Tajik, Shahin and Guin, Ujjwal and Farahmandi, Farimah and Tehranipoor, Mark},
  booktitle={IEEE Physical Assurance and Inspection of Electronics (PAINE)},
  pages={1--6},
  year={2020}
}

@inproceedings{jain2020special,
  title="{Special Session: Novel Attacks on Logic-Locking}",
  author={Jain, Ayush and Guin, Ujjwal and Rahman, M Tanjidur and Asadizanjani, Navid and Duvalsaint, Danielle and Blanton, RD Shawn},
  booktitle={VLSI Test Symposium (VTS)},
  pages={1--10},
  year={2020}
}

@inproceedings{xie2020special,
  title="{Special Session: The Recent Advance in Hardware Implementation of Post-Quantum Cryptography}",
  author={Xie, Jiafeng and Basu, Kanad and Gaj, Kris and Guin, Ujjwal},
  booktitle={VLSI Test Symposium (VTS)},
  pages={1--10},
  year={2020}
}

@inproceedings{wang2020zero,
  title="{A Zero-Cost Detection Approach for Recycled ICs using Scan Architecture}",
  author={Wang, Wendong and Guin, Ujjwal and Singh, Adit},
  booktitle={VLSI Test Symposium (VTS)},
  pages={1--6},
  year={2020}
}

@inproceedings{zhang2019tga,
  title="{TGA: An Oracle-less and Topology-Guided Attack on Logic Locking}",
  author={Zhang, Yuqiao and Cui, Pinchen and Zhou, Ziqi and Guin, Ujjwal},
  booktitle={Proceedings of the 3rd ACM Workshop on Attacks and Solutions in Hardware Security Workshop},
  pages={75--83},
  year={2019}
}

@inproceedings{cui2019countering,
  title="{Countering Botnet of Things using Blockchain-Based Authenticity Framework}",
  author={Cui, Pinchen and Guin, Ujjwal},
  booktitle={IEEE Computer Society Annual Symposium on VLSI (ISVLSI)},
  pages={598--603},
  year={2019}
}

@inproceedings{guin2019detecting,
  title="{Detecting Recycled SOCs by Exploiting Aging Induced Biases in Memory Cells}",
  author={Guin, Ujjwal and Wang, Wendong and Harper, Charles and Singh, Adit D},
  booktitle={IEEE International Symposium on Hardware Oriented Security and Trust (HOST)},
  pages={72--80},
  year={2019}
}

@inproceedings{mahmod2019special,
  title="{Special Session: Delay Fault Testing - Present and Future}",
  author={Mahmod, Jubayer and Millican, Spencer and Guin, Ujjwal and Agrawal, Vishwani},
  booktitle={VLSI Test Symposium (VTS)},
  pages={1--10},
  year={2019}
}

@inproceedings{chowdhury2019two,
  title="{Two-pattern $\Delta_{IDDQ}$ Test for Recycled IC Detection}",
  author={Chowdhury, Prattay and Guin, Ujjwal and Singh, Adit D and Agrawal, Vishwani D},
  booktitle={International Conference on VLSI Design and International Conference on Embedded Systems (VLSID)},
  pages={82--87},
  year={2019}
}

@inproceedings{guin2018ensuring,
  title="{Ensuring Proof-of-Authenticity of IoT Edge Devices using Blockchain Technology}",
  author={Guin, Ujjwal and Cui, Pinchen and Skjellum, Anthony},
  booktitle={IEEE International Conference on Internet of Things (iThings) and IEEE Green Computing and Communications (GreenCom) and IEEE Cyber, Physical and Social Computing (CPSCom) and IEEE Smart Data (SmartData)},
  pages={1042--1049},
  year={2018}
}

@inproceedings{wang2018exploiting,
  title="{Exploiting Power Supply Ramp Rate for Calibrating Cell Strength in SRAM PUFs}",
  author={Wang, Wendong and Singh, Adit and Guin, Ujjwal and Chatterjee, Abhijit},
  booktitle={Latin-American Test Symposium (LATS)},
  pages={1--6},
  year={2018}
}

@inproceedings{alam2018robust,
  title="{Robust, Low-Cost, and Accurate Detection of Recycled ICs using Digital Signatures}",
  author={Alam, Mahabubul and Chowdhury, Sreeja and Tehranipoor, Mark M and Guin, Ujjwal},
  booktitle={IEEE International Symposium on Hardware Oriented Security and Trust (HOST)},
  pages={209--214},
  year={2018}
}

 @inproceedings{zhou2018modeling,
  title="{Modeling and Test Generation for Combinational Hardware Trojans}",
  author={Zhou, Ziqi and Guin, Ujjwal and Agrawal, Vishwani D},
  booktitle={VLSI Test Symposium (VTS)},
  pages={1--6},
  year={2018}
}

  @inproceedings{guin2018secure,
  title="{A Secure Low-Cost Edge Device Authentication Scheme for the Internet of Things}",
  author={Guin, Ujjwal and Singh, Adit and Alam, Mahabubul and Canedo, Janice and Skjellum, Anthony},
  booktitle={International Conference on VLSI Design and International Conference on Embedded Systems (VLSID)},
  pages={85--90},
  year={2018}
}

@article{guinefficient,
  title="{Efficient Strategies for Detection and Avoidance of Counterfeit ICs}",
  author={Guin, Ujjwal},
  journal={IEEE North Atlantic Test Workshop (NATW)},
  year={2017}
}

  @inproceedings{guin2017novel,
  title="{A Novel Design-for-Security (DFS) Architecture to Prevent Unauthorized IC Overproduction}",
  author={Guin, Ujjwal and Zhou, Ziqi and Singh, Adit},
  booktitle={VLSI Test Symposium (VTS)},
  pages={1--6},
  year={2017}
}

 @inproceedings{shakya2015performance,
  title="{Performance Optimization for On-Chip Sensors to Detect Recycled ICs}",
  author={Shakya, Bicky and Guin, Ujjwal and Tehranipoor, Mark and Forte, Domenic},
  booktitle={IEEE International Conference on Computer Design (ICCD)},
  pages={289--295},
  year={2015}
}

@inproceedings{guin2014low,
  title="{Low-Cost On-Chip Structures for Combating Die and IC Recycling}",
  author={Guin, Ujjwal and Zhang, Xuehui and Forte, Domenic and Tehranipoor, Mohammad},
  booktitle={ACM/EDAC/IEEE Design Automation Conference (DAC)},
  pages={1--6},
  year={2014}
}

@article{guin2014icdetect,
  title="{Counterfeit IC Detection: Test Method Selection Considering Test Time, Cost, and Tier Level Risk}",
  author={Guin, Ujjwal and Forte, Domenic and DiMase, Daniel and Tehranipoor, Mohammad},
  journal={GOMACTech},
  year={2014}
}

@article{guin2014cost,
  title="{ Low-cost On-Chip Structures for Combating Die and IC Recycling }",
  author={Guin, Ujjwal and Forte, Domenic and Tehranipoor, Mohammad},
  journal={GOMACTech },
  year={2014}
}

 @inproceedings{guin2013anti,
  title="{Anti-counterfeit techniques: From design to resign}",
  author={Guin, Ujjwal and Forte, Domenic and Tehranipoor, Mohammad},
  booktitle={International workshop on Microprocessor Test and Verification (MTV)},
  pages={89--94},
  year={2013}
}
  
@article{guin2013cdir,
  title="{ CDIR: Low-Cost Combating Die/IC Recycling Structures }",
  author={Guin, Ujjwal and Tehranipoor, Mohammad},
  journal={DMSMS},
  year={2013}
}
 @inproceedings{guin2013functional,
title="{Functional $F_max$ test-time reduction using novel DFTs for circuit initialization}",
  author={Guin, Ujjwal and Chakraborty, Tapan and Tehranipoor, Mohammad},
  booktitle={International Conference on Computer Design (ICCD)},
  pages={1--6},
  year={2013}
}

@inproceedings{guin2013novel,
  title="{Novel DFTs for Circuit Initialization to Reduce Functional Fmax Test Time}",
  author={Guin, Ujjwal and Chakraborty, Tapan and Tehranipoor, Mohammed},
  booktitle={IEEE North Atlantic Test Workshop (NATW)},
  year={2013}
}

@inproceedings{guin2013selection,
  title="{On Selection of Counterfeit IC Detection Methods}",
  author={Guin, Ujjwal and Tehranipoor, Mohammad},
  booktitle={IEEE north atlantic test workshop (NATW)},
  year={2013}
}

@article{guin2013asses,
  title="{ Counterfeit Detection Technology Assessment }",
  author={Guin, Ujjwal and Tehranipoor, Mohammad},
  journal={ GOMACTech },
  year={2013}
}

@article{murphy2012asses,
  title="{ Counterfeit Detection Technology Assessment }",
  author={Murphy, N and Guin, Ujjwal and Tehranipoor, Mohammad},
  journal={ DMSMS \& Standardization},
  year={2012}
}

@inproceedings{guin2011design,
  title="{Design For Bit Error Rate Estimation of High Speed Serial Links}",
  author={Guin, Ujjwal and Chiang, Chen-Huan},
  booktitle={VLSI Test Symposium (VTS)},
  pages={278--283},
  year={2011}
}

@article{guin2013counterfeit,
  title="{Counterfeit IC detection and challenges ahead}",
  author={Guin, Ujjwal and Tehranipoor, Mohammad and DiMase, Dan and Megrdichian, Mike and others},
  journal={ACM SIGDA},
  volume={43},
  number={3},
  pages={1--5},
  year={2013}
}