Welcome to:

Topics	Recent Papers
Configurable SoC BIST	FPGAs: Excellent Platforms for SoC Testing R&D (ITC'08 – Elevator Talk) BIST of Configurable Cores in SoCs Using Embedded Processor Dynamic Reconfiguration (ISoCC'05) On-Chip BIST-Based Diagnosis of Embedded Programmable Logic Cores in SoCs (CATA'05) Built-In Self-Test and Diagnosis of Multiple Embedded Cores in SoCs (ESA'05) A System for Automated BIST of Embedded Memory Cores in System-on-Chip (SSST'05) Embedded Processor Reconfiguration of Logic BIST for FPGA Cores in SoCs (NATW'05) Built-In Self-Test for System-on-Chip: A Case Study (ITC'04)
FPGA Logic BIST	Built-In Self-Test of Embedded Memory Cores in Virtex-5 Field Programmable Gate Arrays (SSST'11) Built-In Self-Test of Programmable Clock Buffers in Virtex-4, Virtex-5 and Virtex-6 FPGAs (SSST'11) Built-In Self-Test for Multipliers in Altera Cyclone II Field Programmable Gate Arrays (SSST'11) The First Clock Cycle is a Real BIST (ESA'10) Soft-Core Embedded Processor-Based Built-In Self-Test of FPGAs: A Case Study (SSST'10) Soft Core Embedded Processor Based Built-In Self-Test of FPGAs (DFTS'09) Built-In Self-Test for Memory Resources in Virtex-4 Field Programmable Gate Arrays (CATA'09) Built-In Self-Test of Configurable Logic Blocks in Virtex-5 FPGAs (SSST'09) Built-In Self-Test of Digital Signal Processors in Virtex-4 FPGAs (SSST'09) Embedded Processor-Based BIST and Diagnosis of Logic and Memory Resources in FPGAs (ESA'06) BIST for Logic and Memory Resources in Virtex-4 FPGAs (NATW'06) Built-In Self-Test of Virtex and Spartan II FPGAs Using Partial Reconfiguration (NATW'05) On-Line BIST and BIST-Based Diagnosis of FPGA Logic Blocks (TVLSI'04)
FPGA Routing BIST	Built-In Self-Test of Global Routing Resources in Virtex-4 FPGAs (SSST'09) Analysis and Evaluation of Routing BIST Approaches for FPGAs (NATW'07) BIST-Based Delay-Fault Testing in FPGAs (JETTA'03) BIST-Based Diagnosis of FPGA Interconnect (ITC'02)
FPGA I/O BIST	On System-Level Use of BIST for Programmable Input/Output Buffers in FPGAs (SECON'10) Built-In Self-Test of Programmable Input/Output Tiles in Virtex-5 FPGAs (SSST'09) Built-In Self-Test of Programmable I/O Cells in Virtex-4 FPGAs (NATW'08) System-Level BIST for Programmable I/O Cells in FPGAs and SoCs (NATW'06) Built-In Self-Test for Programmable I/O Buffers in FPGAs and SoCs (SSST'06) Built-In Self-Test for I/O Buffers in FPGAs (NATW'05)
SEUs in FPGAs	BIST of Embedded SEU Detection and Correction Cores in Virtex-4 and Virtex-5 FPGAs (ESA'09) Embedded Processor Based Fault Injection and SEU Emulation for FPGAs (ESA'09) Single Event Upset Detection and Correction in Virtex-4 and Virtex-5 FPGAs (CATA'09) An Architecture for Fail-Silent Operation of FPGAs and Reconfigurable SoCs (ESA'06)
Mixed-Signal BIST Analog and Mixed-Signal Testing Benchmark Circuits	Automated Generation of BIST and Measurement Circuitry for Mixed-Signal Circuits and Systems (DFTS'09) Test Time of Multiplier/Accumulator Based Output Response Analyzer in Built-In Analog Functional Testing (SSST'09) FPGA-Based Analog Functional Measurement for Adaptive Control in Mixed-Signal Systems (TIE'07) Noise Figure Measurement Using Mixed-Signal BIST (ISCAS'07) Phase Delay Measurement and Calibration in Built-In Analog Functional Testing (SSST’07) DDS-Based Mixed-Signal Built-In Self-Test (BIST) System (VFIS’07) Automatic Linearity and Frequency Response Tests with Built-in Pattern Generator and Analyzer (TVLSI'06) Analog Frequency Repsonse Measurement in Mixed-Signal Systems (ISCAS'06) Phase Delay in MAC-Based Analog Functional Testing in Mixed-Signal Systems (NATW'06) Built-In Self-Test for Automatic Analog Frequency Response Measurement (ISCAS'05) Automatic Linearity (IP3) Test with Built-In Pattern Generator and Analyzer (ITC'04)
Other Design and Test	On Built-In Self-Test for Multipliers (SECON'10) PSIM: A Processor SIMulator for Basic Computer Architecture and Operation Education (SECON'10) On Built-In Self-Test for Adders (JETTA'09) Application of Embedded Systems in Low Earth Orbit for Measurement of Ionospheric Anomalies (ESA'09) Built-In Self-Test for a Monobit Fast Fourier Transform Receiver (NATW'05)

The BIST Dudes & Dudettes:

The AUBIST Laboratory is a member of

Some recent accomplishments by the BIST Dudes & Dudettes:

Spring 2010: Jie Qin was named Auburn University Outstanding PhD Student for 2009-2010, Bill Tomas and Alex Lusco presented posters at the 7^th Annual Undergraduate Research Forum

Spring 2009: Brad Dutton was named Auburn University Outstanding MS Student for 2008-2009, Jie Qin was named Electrical & Computer Engineering Outstanding International Graduate Student, and Electrical & Computer Engineering Outstanding Faculty Member Award to C. Stroud

July 2007: C. Stroud was Keynote Speaker at Cypress International Technical Conference

May 2007: IEEE North Atlantic Test Workshop Best Student Paper Award Honorable Mention went to Bobby Dixon

Spring 2007: College of Engineering Outstanding Coop Student Award to Mustafa Ali and College of Engineering William F. Walker Teaching Award for Excellence to C. Stroud

AUBUST in the News

FPGA delay fault testing animation by John Sunwoo

Srinivas Garimella was named Auburn University Outstanding MS Student for 2004-2005.

Happy BISTing!!!