The IEEE North Atlantic Test
Workshop provides a forum for discussions on the latest issues relating to
high quality, economical, and efficient test methodologies and designs. With
the continuing push to smaller technology and increased complexity in
design and test of ICs and systems, the 21st NATW will feature: "Testing Challenges in Mobile Computing".
We encourage student participation by presenting a Best Student
The NATW 2012 program began Wednesday May 9th with
a tutorial in the afternoon and
a panel session in the evening:
12:30-4:30pm Tutorial: Testing of 3-D Stacking
Devices by Prof. Krishnendu Chakrabarty, Duke Univ.
7:30-9:00pm Panel Session: Test Challenges of 3-D Stacking
Structures, Chair: Gene Atwood (IBM), Organizer: Yu Huang (Mentor Graphics)
Dinner was provided at approximately 6:15pm
These Wednesday events were open to all registered NATW 2012
attendees at no additional charge
NATW now has a page on FaceBook.
Check it out at: