General Chair

L. Milor - Georgia Tech.

Vice General Chair

M. Margala, U. Mass-Lowell

Program Chair

V. Iyengar - IBM

Vice Program Chair

J. Dworak - Brown U.

Panel Chair

P. Nsame - IBM

Finance Chair

J. Monzel - ASIC North

Publicity Chair

T. Xia - U. Vermont

Industry Liaison

S. Wu - SynTest Tech.

TTTC Liaison

J.-C. Lo – U. RI.

Local Arrangements

P. Song – IBM

Paper Submission Web Site

Ismet Bayraktaroglu

Program Committee

W. Al-Assadi – MO. U. S&T

V. Bertacco – U. Michigan

R. Davies - Intel

R. Dean Adams - Magma

S. Blanton - CMU

K. Chakravadhanula - Cadence

S. Chakradhar - NEC

A. Chandra - Synopsys

J. Emmert - Wright St. U.

D. Ghosh - Mediatek

M. Hsiao - Virginia Tech.

Y. Huang - Mentor Graphics

N. Jha - Princeton Univ.

R. Karri - NY Polytechnic U.

S. Kim - IBM

B. Kim - U. Alabama

S. Kundu - U. Mass

C. Liu - nVidia

X. Lin - Mentor Graphics

F. Lombardi - Northeastern U.

Y. Ma - Advantest America

Y. Makris -Yale

S. Mitra - Stanford U.

N. Nicolici – McMaster U.

M. Ottavi - AMD

J. Plusquellic - UMBC

S. Reddy – U. Iowa

M. Tahoori - Northeastern U.

M. Tehranipoor - U. Conn.

R. Tekumalla - AMD

H. Walker - Texas A&M

Y. Wu – Nortel

J. Xiong - IBM

D. Zhao -U. LA-Lafayette

Steering Committee

V. Agrawal - Auburn U.

T. Cooley

X. Chen

K. Panetta - Tufts Univ.

M. Bushnell - Rutgers U.

S. Ozev – Arizona State U.

C. Stroud – Auburn U.

Call for Papers 18^th North Atlantic Test Workshop May 13-15, 2009 Le Chambord (tentative) Hopewell Junction, NY

in co-operation with

2009 NATW web site: www.eng.auburn.edu/~strouce/NATW2009.html

The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs. With the continuing increase in complexity in design and test of ICs and systems, the 18th NATW will feature: "Simple Solutions Revolutionize Test". Topics of interest include, but are not limited to, the following:

Analog/Mixed Signal Testing Built-In Self-Test (BIST) Board Level Testing Delay/Performance Testing Design Verification/Validation Defect-Based Testing Diagnosis and Debug Embedded Core Testing Fault Modeling/Simulation FPGA Testing IDDQ Testing

DFM & Defect Analysis Multi-Chip Module Testing Memory Testing MEMS Testing Nanotechnology Testing Online Testing RF Testing System-on-Chip (SOC) Test/Debug Test Quality/System Reliability Test Resource Partitioning Testing for Soft Errors/Defects

The Program Committee invites authors to submit original, unpublished papers and panel proposals. Submissions may be in terms of extended summaries or full papers. Detailed instructions for submission can be found on the “Author Information and Paper Submission” link at www.eng.auburn.edu/~strouce/NATW2009.html.

Jake Karrfalt Best Student Paper Award

To encourage student participation in the testing research community, NATW has sessions dedicated to student presentations and includes a Best Student Paper Award. We believe that it is important to integrate students into the research and development community early in their careers so that they can experience the excitement of direct interaction with their peers.

Important Dates:
Submission of papers – February 1, 2009 Notification of paper acceptance – March 1, 2009 Submission of final PDF papers – March 29, 2009 Submission of final PPT presentations – April 12, 2009
For general information, contact: Dr. Linda Milor, General Chair Georgia Tech Phone: 404-894-4793 Email: linda.milor@ece.gatech.edu	For program information, contact: Dr. Vikram Iyengar, Program Chair IBM Phone: 412-222-5928 Email: vikrami@us.ibm.com

The 2009 NATW is sponsored in part by the IEEE Green Mountain Section, the IEEE Circuits & Systems Society, and IEEE Women in Engineering

Corporate/Academic Support packages available for 2009. Please see our website for more details. Corporate/Academic Supporters for 2009 include: