|
General Chair
S. Ozev
- Duke U.
Vice
General Chair
V. Agrawal
- Auburn U.
Program
Chair & TTTC Liaison
C. Stroud - Auburn U.
Vice
Program Chair
V. Iyengar
- IBM
Publication
Chair
J. Dworak
- Brown U.
Panel
Chair
L. Milor
- Georgia Tech.
Finance
Chair
J. Monzel
- ASIC North
Industry Liaison
S. Wu -- SynTest Tech.
Registration
Xinghao Chen
Local
Arrangements
R. Davies - Intel
M. Margala,
U. Mass-Lowell
Audio/Visual
Arrangements
E. Cooley - Dartmouth U.
Program
Committee
R. Dean Adams - Magma
S. Blanton - CMU
K. Chakrabarty
- Duke U.
S. Chakradhar
- NEC
K. Chakravadhanula
- Cadence
J. Emmert
- Wright St. U.
R. Hart - Step Tech Inc.
M. Hsiao - Virginia Tech.
Y. Huang - Mentor Graphics
N. Jha
- Princeton Univ.
R. Karri - NY Polytechnic U.
B. Kim - U. Alabama
P.K. Lala - U. Arkansas
C. Liu - nVidia
X. Lin - Mentor Graphics
F. Lombardi -
Northeastern U.
Y. Ma - Advantest America
Y. Makris -Yale
S. Mitra - Stanford U.
M. Ottavi - AMD
J. Plusquellic - UMBC
A. Sanyal
– U. Mass
M. Tahoori
- Northeastern U.
M. Tehranipoor
- U. Connecticut
R. Tekumalla
- AMD
J. Tellier
-Western Digital
S. Upadhyaya
- SUNY Buffalo
Y. Wu - Nortel
T. Xia - U. Vermont
D. Zhao -U.
Louisiana-Lafayette
Steering
Committee
X. Chen - CCNY
J. Karrfalt
- ASC Inc.
J.C. Lo - Univ. R.I.
J. Monzel - IBM
K. Panetta - Tufts Univ.
M. Bushnell - Rutgers U.
I. Harris - UC, Irvine
P. Song - IBM
|
|
|
Call
for Papers
17th North
Atlantic Test Workshop
May 14-16, 2008
Holiday Inn
Boxborough, MA
|
in association with
|
2008 NATW web site:
www.eng.auburn.edu/~strouce/NATW2008.html
|
The IEEE North Atlantic Test Workshop provides a
forum for discussions on the latest issues relating to high quality, economical,
and efficient test methodologies and designs. With the continuing
increase in complexity in design and test of ICs and systems, the 17th
NATW will feature dual themes: "Breaking Testing Barriers" and “Women in Test”
with special presentations and a panel session dedicated to Women in Test. Topics of interest include, but
are not limited to, the following:
|
|
Analog/Mixed Signal Testing
Built-In Self-Test (BIST)
Board Level Testing
Delay/Performance Testing
Design Verification/Validation
Defect-Based Testing
Diagnosis and Debug
Embedded Core Testing
Fault Modeling/Simulation
FPGA Testing
IDDQ Testing
DFM & Defect Analysis
|
Multi-Chip Module Testing
Memory Testing
MEMS Testing
Nanotechnology Testing
Online Testing
RF Testing
System-on-Chip (SOC) Test/Debug
Test Quality/System Reliability
Test Resource Partitioning
Testing for Soft Errors/Defects
Women in Test & Related Issues
|
|
The Program Committee invites authors to submit
original, unpublished papers and panel proposals. Submissions may be in terms of
extended summaries or full papers.
Detailed instructions for submission can be found on the “Author Information and Paper
Submission” link at www.eng.auburn.edu/~strouce/NATW2008.html.
|
|
Jake Karrfalt
Best Student Paper Award
|
|
To encourage student participation in the
testing research community, NATW has sessions dedicated to student
presentations and includes a Best Student Paper Award. We believe that it is important to
integrate students into the research and development community early in
their careers so that they can experience the excitement of direct
interaction with their peers.
|
|
Important Dates:
|
|
Submission of papers– February 1, 2008
For those authors that need an extension – February 8, 2008
Notification of paper acceptance – March 3, 2008
Submission of camera-ready papers – March 31, 2008
Submission of final PPT presentation – April 14, 2008
|
|
For general
information, contact:
Dr. Sule Ozev, General Chair
Duke University
ECE Department, Box 90291
Durham, NC 27708
Phone: 919-660-5273
Email: sule@ee.duke.edu
|
For program
information, contact:
Dr. Charles Stroud, Program Chair
Auburn University
ECE Department, 200 Broun Hall
Auburn, AL 36849-5201
Phone: 334-844-1806
Email: strouce@auburn.edu
|
|
The 2008 NATW is sponsored in part by the IEEE Green Mountain Section
and the IEEE Women In Engineering Committee.
|
Corporate/Academic Supporters for 2008 include:
 
|
|