Jake Karrfalt Best Student Paper Award

To encourage student participation in the testing research community, NATW dedicates sessions to student presentations and presents a Best Student Paper Award. We feel that it is important to integrate students into the testing research community early in their careers so that they can experience the excitement of direct interaction with their peers. In 2006, the NATW Best Student Paper Award was named in honor of Jake Karrfalt.

Jake Karrfalt Best Student Paper Award Recipients:

2009 = Ke Peng (Univ. of Connecticut), “Efficient Pattern Grading for Small Delay Defects in Digital Integrated Circuits” (co-authors M. Yilamaz, K. Chakrabarty, and M. Tehranipoor),

2008 = Xiaoxiao Wang (Univ. of Connecticut), “Path-RO: On-Chip Critical Path Delay Measurement Under Process Variations” (co-authors: M. Tehranipoor and R. Datta)

2007 = Alodeep Sanyal (Univ. of Massachusetts), “A Co-evolutionary Algorithm for Dynamic Power Minimization During Scan Testing” (co-authors: A. Sokolov, Y. Malaiya and D. Whitley)

2006 = Nitin Yogi (Auburn Univ.), “High-Level Test Generation for Gate-Level Fault Coverage” (co-author: V. Agrawal)

2005 = Jack Smith (Univ. of Vermont), “Automated BIST Testing of Delay Faults in FPGA Interconnect” (co-author: T. Xiao)

2004 = Anuja Sehgal (Duke Univ.), “Cost-Oriented Test Plan Development for Mixed-Signal SOCs with Wrapped Analog Cores” (co-authors: S. Ozev and K. Chakrabarty)

2003 = Dan Zhao (SUNY-Buffalo), “A New Distributed Test Control Architecture with Multiple Wireless Test Connectivity and Communication for Gigahertz System-Chips” (co-authors: S. Upadhyaya, and M. Margala)

2002 = Lan Rao (Rutgers Univ.), “New Graphical Iddq Signatures Reduce Defect Level and Yield Loss” (co-authors: M. Bushnell and V. Agrawal)