Delay Test Quality Evaluation Using Bounded Gate Delays

 

Speaker: Vishwani D. Agrawal

Date: Wednesday, April 11, 2007

Time: 4:00PM

Room: Broun 235

 

Abstract:

 

Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are invalidated by hazards caused primarily due to non-zero delays of off-path circuit elements. Thus, non-robust tests are of limited value when process variations change gate delays. We propose a bounded gate delay model for test quality evaluation and give a novel simulation algorithm that is less pessimistic than previous approaches. The key idea is that certain time-correlations among the multiple transitions at the inputs of a gate cannot cause hazard at its output. We maintain ``ambiguity lists'' for gates. These are propagated with events, similar to fault lists in a traditional concurrent fault simulation. They are used to suppress erroneous unknown states. Experimental results for ISCAS benchmarks with gate delay variation of 14% show a miscorrelation of critical path delay as much as 20%.

 

This talk is based on a joint paper with Dr. Soumitra Bose of Intel Corporation, to be presented at the 25th IEEE VLSI Test Symposium, Berkeley, CA, May 6-10, 2007.