The VLSI Design & Test Seminar Series
seeks to provide an open forum for various faculty, graduate and undergraduate students with research and development efforts in the area of design and test of VLSI systems, including application specific and programmable circuits in digital, analog, and mixed-signal microsystems. The goal is to promote further learning, discussion, and teamwork along with the conception and development of exciting new ideas.

The seminar series counts as a 1-credit course ELEC7950 (which may be repeated for up to 3 credits).

 

This seminar series sponsored by:

the Testing Group at Auburn:

Vishwani Agrawal - Design for Testability (DFT) and low-power design

Foster Dai - mixed-signal and analog design and testing

Vic Nelson - ASIC/FPGA testing and fault tolerance

Adit Singh - digital and mixed-signal VLSI design and Design for Testability (DFT)

Chuck Stroud - digital and mixed-signal Built-In Self-Test (BIST)

 

Spring 2007 schedule:

When: Wednesdays from 4-5:30pm

Where: Broun Hall room 235

Coordinator: Chuck Stroud

Invitation: If you are interested in presenting a seminar during Spring 2007, please contact the coordinator.

Notes: The following schedule was for Spring 2007.  The link under Speaker is to an abstract of the presentation and the link under Topic is to a PDF file of the presentation slides.

Date

Speaker (w/ link to abstract)

Topic (w/ link to presentation slides after seminar date)

Jan. 10

J-M Wersinger, COSAM

AUSSP  and Space Radiation Damage to Satellite Electronics

Jan. 19

Joe Bungo, ARM

The ARM CPU Architecture

Jan. 24

Lee Lerner

Fail-Silent and TMR Architectures for FPGAs and Configurable SoCs

Jan. 31

Chuck Stroud

FPGA Architectures and Operation for Tolerating Single Event Upsets

Feb. 7

Chris Erickson

Test Pattern Generation for DSP BIST in Virtex-4

Feb. 14

Testing Group Faculty

Graduate School Research & Expectations – St Valentine’s Day Massacre

Feb. 21

Jie Qin

BIST-Based Phase Delay Measurements in Mixed-Signal Systems (SSST paper)

Feb. 28

Nitin Yogi

Transition Delay Fault Testing of Microprocessors by Spectral Method (SSST paper)

Mar. 7

Chuck Stroud

AUSIM: A Simulator for Research and Education Link to AUSIM

Mar. 14

Hillary Grimes

Analyzing Reconvergent Fanouts in Min-Max Delay Fault Simulation

Mar. 21

Vic Nelson

The Cypress Programmable System-on-Chip (PSoC)

Apr. 4

Daniel Milton

BIST for Block RAMs in Virtex-4 FPGAs

Apr. 11

Vishwani Agrawal

Delay Test Quality Evaluation Using Bounded Gate Delays (VTS paper)

Apr. 18

Nitin Yogi

Gefu Xu

Bobby Dixon

Optimizing Tests for Multiple Fault Models (NATW paper)

High Coverage Delay Test with Partial DTSFF Scan Chains (NATW paper)

Analysis and Evaluation of Routing BIST Approaches for FPGAs (NATW paper)

Apr. 26

Gefu Xu

Delay Test Scan Flip-Flop Design and Application for Scan Based Delay Testing (PhD Proposal)

May 4

Nitin Yogi

Gate-level Test Generation using Spectral Methods at Register Transfer Level (PhD Proposal)

May 21

Yuanlin Lu

Power and Performance Optimization of Static CMOS Circuits with Process Variation (PhD Defense)

 

Links to previous semesters of the VLSI Design & Test Seminar Series:

Fall 2006: Coordinator Adit Singh

Spring 2006: Coordinator Vishwani Agrawal

Fall 2005: Coordinator Chuck Stroud

Spring 2005: Coordinator Adit Singh

Fall 2004: Coordinator Chuck Stroud