Charles E. Stroud
Professor, IEEE Fellow
Dept. of
Electrical & Computer Engineering
200 Broun Hall
Phone:
(334)844-1806, FAX: (334)844-1809
Office: 325
Broun Hall
Research Lab:
314 Broun Hall
Teaching
Office Hours: 12-2pm MWF for Spring 2012
ELEC
2200 Digital Logic Circuits (Spring 2012)
ELEC
4200 Digital System Design (Spring 2012)
ELEC
5280/6280 Built-In Self-Test
Some Links
of Potential Interest to Students:
Research
Topic Areas:
BIST for SoCs
BIST for Mixed-Signal Systems
BIST for FPGAs and CPLDs
BIST for Regular Structures
BIST for Digital VLSI &
ASICs
Other Design & Test
Topics
AUSIM Logic & Fault Simulator (also some other tools)
The VLSI Design & Test Seminar Series (sponsored
by the Testing Group at
C. Stroud current conference
Steering Committees:
IEEE SE Symp on
System Theory 
IEEE North Atlantic Test
Workshop
Publications
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