Expertise
Radio frequency integrated circuit (RFIC) designs
Monolithic microwave integrated circuit (MMIC) designs
Digital, analog and mixed signal integrated circuit (IC) designs
Specialties
VLSI circuits for digital, analog and mixed-signal applications
RFIC designs for wireless and radar applications
Ultra-high frequency synthesis
Analog and mixed signal built-in self-test (BIST)
For details visit
Auburn RFIC Design and Testing Laboratory and other centers:
Alabama Microelectronics Science and Technology Center (AMSTC)
Wireless Engineering Research and Education Center (WEREC)
Wireless Internet Center for Advanced Technology (WICAT)
Center for Advanced Vehicle Electronics (CAVE)
Applications
Wireless, Wire-line, Radar and Satellite Applications
Research Funding
Multi-million-dollar research contracts on integrated circuit designs sponsored by
National Aeronautics and Space Administration (NASA), Defense Advanced Research Projects Agency (DARPA), US Army Research Lab (ARL), National Science Foundation (NSF), US Army Space and Missile Defense
Command (SMDC) and other government and industrial funding agents.
Industrial Experiences
Hughes Network
Systems
Analog and digital
application specific integrated circuit (ASIC) for wireless and
satellite communication system, leading
role in frequency synthesizer IC designs
for broadband communications.
YAFO
Networks Inc.
Leading role in
high-speed IC designs for OC-192 10Gb/s and OC-768 40Gb/s
fiber communications.
Cognio
Inc. (Acquired by Cisco Systems)
RFIC design for wireless local area networks (WLAN), leading
role in frequency
synthesizer IC designs for
integrated WLAN transceivers.
Book and Book Chapters
 |
Integrated Circuit Design for High-Speed Frequency Synthesis ARTECH HOUSE PUBLISHERS, INC. February 2006. ISBN: 1-58053-982-3 |
 |
Chapter 15 Frequency Synthesis for Multi-band Wireless
Networks Wireless Technologies: Circuits, Systems and Devices CRC Press, October 2007. ISBN:978-0849379963 |
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Chapter 15 Analog and Mixed-Signal Test Architectures System-on-Chip Test Architectures: Nanometer Design for Testability Morgan Kaufmann, November, 2007. ISBN: 978-0-12-373973-5 |