The VLSI Design & Test Seminar Series

seeks to provide an open forum for various faculty, graduate and undergraduate students with research and development efforts in the area of design and test of VLSI systems, including application specific and programmable circuits in digital, analog, and mixed-signal microsystems. The goal is to promote further learning, discussion, and teamwork along with the conception and development of exciting new ideas.

The seminar series counts as a 1-credit course ELEC7950 (which may be repeated for up to 3 credits).


This seminar series sponsored by:

the Testing Group at Auburn:

Vishwani Agrawal - Design for Testability (DFT) and low-power design

Foster Dai - mixed-signal and analog design and testing

Vic Nelson - ASIC/FPGA testing and fault tolerance

Adit Singh - digital and mixed-signal VLSI design and Design for Testability (DFT)

Professor Emeritus: Chuck Stroud - digital and mixed-signal Built-In Self-Test (BIST)


Spring 2016 schedule:

When: Wednesdays 4-5:30pm

Where: Broun Hall room 235

Coordinator: Vishwani Agrawal

Invitation: If you are interested in presenting a seminar or defending your thesis/dissertation, please contact the coordinator.

Notes: The following is a tentative schedule (speakers/topics in blue text are not confirmed at this point).  A link under Speaker is to an abstract of the presentation and a link under Topic is to a file of the presentation slides.



Topic (w/ link to presentation slides after seminar date)

Jan 13

Vishwani Agrawal

Course Introduction

Jan 20

Murali Venkatasubramanian

Database Search and ATPG - Interdisciplinary Domains and Algorithms

Jan 27

Harshit Goyal

Characterizing Processors for Energy and Performance Management

Feb 3

Victor Nelson

Functional and Parametric IC Testing on the Advantest T2000 Test System

Feb 10

Victor Nelson

Computer-Aided Design of Application-Specific Integrated Circuits – From Concept to Silicon

Feb 17-18

Prof. Janak Patel (UIUC)

Illinois Scan Architecture
Can we Save Energy if we allow Errors in Computing?

Feb 24

Prof. Abhijit Chatterjee (Georgia Tech)

Learning-Assisted Efficient Error Detection and Correction in Real-Time Signal Processing and Control Systems

Mar 2

Sungil Kim

Analytical Delay and Variation Modeling for Subthreshold Circuits

Mar 9

Nansen Huang
Mingnan Yuan

Simulation-Based Equivalence Checking
Wi-Fi - IEEE Standards and the future of Wi-Fi

Mar 16

No seminar

Spring break

Mar 23

Ya Guo
Ziqi Zhou

Dielectric Permittivity Characterization Using Microstrip Ring Resonator
Combinational Circuit ATPG Based on PODEM

Mar 30

Jayanth Vuddagiri
Mi Yan

SLAM Techniques (Robotics)
ATPG for Synchronous Sequential Circuits

Apr 6

Perik Patva

Multi-Cycle Scan Based Testing

Apr 13

Gabriel Samuel Motunde

Integrating PV System to the Power Grid Outside U.S.A. (Nigeria)

Apr 20

Yun Wang (MRI Research)

Layer-Specific Connectivity Analysis With High-Resolution Functional MRI

Apr 27

Sourabh Sanghavi
Yatish Kaveti

GPS Navigation
PV Systems: Maximum Power Point Tracking (MPPT)


Links to previous semesters of the VLSI Design & Test Seminar Series:


Spring 2014: Coordinator Vishwani Agrawal

Spring 2012: Coordinator Chuck Stroud

Fall 2011: Coordinator Vishwani Agrawal

Spring 2011: Coordinator Adit Singh

Fall 2010: Coordinator Adit Singh

Spring 2010: Coordinator Chuck Stroud

Fall 2009: Coordinator Vishwani Agrawal

Spring 2009: Coordinator Adit Singh

Fall 2008: Coordinator Chuck Stroud

Spring 2008: Coordinator Vishwani Agrawal

Fall 2007: Coordinator Adit Singh

Spring 2007: Coordinator Chuck Stroud

Fall 2006: Coordinator Adit Singh

Spring 2006: Coordinator Vishwani Agrawal

Fall 2005: Coordinator Chuck Stroud

Spring 2005: Coordinator Adit Singh

Fall 2004: Coordinator Chuck Stroud