E7250 Class Projects (Spring 2004)
Assigned 02-26-04, to be completed 03-25-04

General Instructions:

1. Form a team of 1 to 5 members and select any one project.

2. Examine the problem, study literature, sketch a solution, identify tasks and assign to team members, and create a project plan with a time schedule for completion.

3. Submit a one-page project plan (title, team members, and list of tasks with completion dates) by 03-09-04.

4. Following items are available:
(a) c17.bench, a small circuit netlist for program debugging.
(b) 74181.bench, a larger circuit netlist to demonstrate results.
(c) Circuit diagrams (MSWord): c17 74181
(d) Hitec, an ATPG program on ECE Unix computers.
(e) Proofs, a fault simulator program in the Hitec package on ECE Unix computers.
(f) Hitec and Proofs user manual: ps pdf

5. Programs should be written such that they can be compiled and run by others. User interface should be simple and intuitive.

6. Project report should contain:
(a) Abstract - Problem solved, main ideas, sample results.
(b) Introduction - Problem explained, background surveyed, organization of the report.
(c) Analysis and algorithms (use simple examples for illustrations).
(d) Results - user information, example results, inferences.
(e) Conclusion - Accomplishments, lessons learned, suggested improvements.

Project Descriptions:

Project 1: Write a program for dominance fault collapsing. Compare the sizes of the dominance and equivalence collapsed fault sets. Compare the Hitec ATPG results for the two collapsed fault sets.

Project 2: Write a program to obtain probabilistic testability for all stuck-at faults in a combinational circuit (see reference [98]). List 10% of most difficult to test faults. Examine an ATPG strategy in which the most difficult faults are targeted first.

Project 3: Write a fault simulator for combinational circuits using the parallel pattern single fault propagation (PPSFP) method (see reference [704]). Using your simulator develop a random pattern ATPG system. Verify results with the Proofs fault simulator.

Project 5: Invent a new ATPG algorithm for combinational circuits using four- state logic (0, 1, D, D-bar). Start with an arbitrary fully- specified input vector and then modify it to detect a target fault. Verify your result using the Proofs fault simulator.

Project 6: Write a program to count the total number of the paths in a combinational circuit and find the critical path(s). Have your program generate a two-vector path delay test to robustly test a critical path. See Chapter 12 and reference [301].