ELEC 5280/6280 Built-In Self-Test

Description: TextbookNext offering may be Fall 2012

 

General Syllabus

 

Fall 2010 Syllabus

 

 

 

 

Lecture Notes:

Overview of BIST

Fault Models, Detection & Simulation

Design for Testability

Test Pattern Generation

Output Response Analysis

Manufacturing & System-Level Use

Built-In Logic Block Observer

Pseudo-Exhausitve BIST

Circular BIST

Scan-Based BIST

Non-Intrusive BIST

BIST for Regular Structures

BIST for FPGAs & CPLDs - BIST History - FPGA Testing

BIST for Mixed-Signal Circuits

Background Lecture Notes:

Anatomy of Flip-Flops

Dr. Nelson’s Lectures Oct. 2008

Assignments for Fall 2010:

Assignment #1 due Friday Aug. 27

Assignment #2 due Monday Aug. 30, also read and study ASL & AUSIM Overview Notes

Assignment #3 due Friday Sep. 3, also read and study AUSIM presentation at VLSI Design & Test Seminar

Assignment #4 due Monday Sep. 13, also try downloading the release version of AUSIM now in the AUSIM.zip file to overcome the problem mentioned in class

Assignment #5 due Monday Sep. 20

Assignment #6 due Friday Oct. 8

Assignment #7 due Monday Nov. 1

Assignment #8 due Monday Nov. 8

Assignment #9 (Graduate Students Only) due Friday Nov. 19

 

AUSIM software, manuals, and notes

ISCAS Benchmark Circuit Assignments for Fall 2010:

S208 Justin P

S298 Navit

S344 Emile

S382 Farhana

S386 Aditi

S420 Lixing

S510 Emir

S641 Ravi Tej

S820 Chidambaram

S838 James

S953 Neil

S1196 Justin D

S1269 Alex

S1423 Qian

S1488 Vijay

 

Related Material:

Adder and Multiplier BIST

Classic ITC Papers

VLSI Design & Test Seminar Presentation 9/6/06 - Testing Parity & Hamming Circuits

Dr. Nelson’s MBIST & LBIST slides

Embedded Systems Lecture 1/27/12 - FPSLIC

Embedded Systems Lecture 1/19/09 - Embedded BIST & Diagnosis

Embedded Systems Lecture 1/30/12 - Embedded Processors in Xilinx FPGAs