Charles E.
Stroud
Professor, IEEE Fellow
Dept. of
Electrical & Computer Engineering
200 Broun Hall
Phone: (334)844-1806,
FAX: (334)844-1809
Office: 325 Broun Hall
Research Labs:
314 Broun Hall and 309 Broun
Hall
Lab Phone:
(334)844-1864 (phone in 309 Broun Hall)
Teaching
Office Hours: 1-2pm and 3-4pm MWF for Fall
2009
ELEC
2200 Digital Logic Circuits (Fall’09)
ELEC
4200 Digital System Design (Fall’09)
ELEC
5250/6250 Computer-Aided Design of Digital Circuits
ELEC
5280/6280 Built-In Self-Test
Some Links of
Interest to Students
C. Stroud Education, Teaching Experience,
Industry Experience, Professional
Service
Research
Topic Areas:
BIST for SoCs
BIST for Mixed-Signal Systems
BIST for FPGAs
and CPLDs
BIST for Regular Structures
BIST for Digital VLSI & ASICs
Other Design & Test
Topics
AUSIM Logic & Fault Simulator (also some other tools)
The VLSI
Design & Test Seminar Series (sponsored by the Testing Group at
Professional
Service
Conference Program/Steering Committees:
IEEE International Test Conf 
IEEE SE Symp on System
Theory 
IEEE North Atlantic Test Workshop
Publications
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Book Review by Scott Davidson in IEEE Design & Test of Computers, July 2005 |
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Book Review by Scott Davidson in IEEE Design & Test of Computers, March 2007 |
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