Charles E.
Stroud
Professor, IEEE Fellow
Dept. of
Electrical & Computer Engineering
200 Broun Hall
Phone:
(334)844-1806, FAX: (334)844-1809
Office: 325 Broun Hall
Research Labs:
314 Broun Hall and 309 Broun
Hall
Lab Phone:
(334)844-1864 (phone in 309 Broun Hall)
Teaching
Office Hours: 12-1pm & 2-3pm MWF for Fall 2008
ELEC
2200 Digital Logic Circuits
ELEC
4200 Digital System Design (Fall08)
ELEC
5250/6250 Computer-Aided Design of Digital Circuits
ELEC
5970/6970 Built-In Self-Test (Fall08)
Some Links
of Interest to Students
C. Stroud Education, Teaching Experience,
Industry Experience, Professional
Service
Research
Topic Areas:
BIST for SoCs
BIST for Mixed-Signal Systems
BIST for FPGAs
and CPLDs
BIST for Regular Structures
BIST for Digital VLSI & ASICs
Other Design & Test
Topics
AUSIM Logic & Fault Simulator (also some other tools)
The VLSI Design
& Test Seminar Series (sponsored by the Testing Group at
IEEE International Test Conf 
IEEE SE Symp on System
Theory 
IEEE North Atlantic Test Workshop
Publications
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Book Review by Scott Davidson in IEEE Design & Test of Computers, July 2005 |
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Book Review by Scott Davidson in IEEE Design & Test of Computers, March 2007 |
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