Wang Research Group

 Department of Chemical Engineering

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Dr. Jin Wang

Assistant Professor

Department of Chemical Engineering

218 Ross Hall

Auburn University, AL 36849

(: (334) 844-2020

Ê: (334) 844-2063

/: wang@auburn.edu

Currently, a POSTDOCTORAL POSITION is available in our group. please read about the position if interested.

 

Education:
  Ph.D., Chemical Engineering, The University of Texas at Austin, 2004
  M.S.,  Chemical Engineering, The University of Texas at Austin, 2001
  B.S.,   Chemical Engineering, Tsinghua University, 1994

Affiliations:

  Cellular & Molecular Biosciences Center (AU-CMB)

  Detection and Food Safety Center (AUDFS)

Honors and awards:

  Key Contributor Award, AMD, 2005
  Vice President Spotlight Award, AMD, 2003, 2004
  Excellent Graduate of Tsinghua University, 1994
  Guanghua Fellowship, 1993
  Changxing Fellowship, 1992
  Outstanding Student Scholarship, Tsinghua University, 1990-1991

Research:
The common theme of our research is to apply systems engineering, in particular, control engineering principles and techniques to understand, predict and further control complex dynamic processes. We have two focus areas:

  • Systems biology:

    • Gene regulatory network identification

    • Early cancer detection

  • Manufacturing process modeling, monitoring and control

    • Semiconductor manufacturing processes

    • Kraft pulping process

Selected Publications:

  • He, Q.P. & Wang, J. (2007), Fault detection using K-nearest neighbor rule for semiconductor manufacturing (invited), IEEE Transactions on Semiconductor Manufacturing. Vol. 20(4), 345-354

  • Bode, C.A., Wang, J., He, Q.P. & Edgar, T.F. (2007), Run-to-run control and state estimation in semiconductor manufacturing (invited), Annual Reviews in Control. Vol. 31, 241-253

  •  He, Q.P., Wang, J., Pottmann, M. & Qin, S.J. (2007), A Curve fitting method for detecting valve stiction in oscillating control loops, Industrial & Engineering Chemistry Research, Vol. 46(13), 4549-4560

  • Wang, J. & He, Q.P. (2007), A new Bayesian approach for fast disturbance detection and classification in microelectronics manufacturing, IEEE Transactions on Semiconductor Manufacturing, Vol. 20(2), 126-136.

  • Wang, J. & Qin, S.J. (2006), Closed-loop subspace identification using the parity space, Automatica, Vol. 42(2), 315-320.