Wang Research Group

 Department of Chemical Engineering

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Dr. Jin Wang

Assistant Professor

Department of Chemical Engineering

218 Ross Hall

Auburn University, AL 36849

(: (334) 844-2020

Ê: (334) 844-2063

/: wang@auburn.edu

Currently, a POSTDOCTORAL POSITION is available in our group. please read about the position if interested.

 

Education:
  Ph.D., Chem. Eng. (Control Eng.), The University of Texas at Austin, 2004
  Ph.D., Chem. Eng. (Biochemical Eng.), Tsinghua University, 1999
  B.S.,   Chem. Eng., Tsinghua University, 1994

Affiliations:

  Cellular & Molecular Biosciences Center (AU-CMB)

  Detection and Food Safety Center (AUDFS)

Honors and awards:

  ORAU Ralph E. Powe Junior Faculty Enhancement Award, 2008

  Key Contributor Award, AMD, 2005

  Vice President Spotlight Award, AMD, 2003, 2004

  Excellent Graduate of Tsinghua University, 1994

  Guanghua Fellowship, 1993

  Changxing Fellowship, 1992

  Outstanding Student Scholarship, Tsinghua University, 1990-1991

Research:
The common theme of our research is to apply systems engineering, in particular, control engineering principles and techniques to understand, predict and further control complex dynamic processes. We have two focus areas:

  • Systems biology:

    • Gene regulatory network identification

    • Early cancer detection

  • Manufacturing process modeling, monitoring and control

    • Semiconductor manufacturing processes

    • Kraft pulping process

Selected Publications:

  • He, Q.P. & Wang, J. (2007), Fault detection using K-nearest neighbor rule for semiconductor manufacturing (invited), IEEE Transactions on Semiconductor Manufacturing. Vol. 20(4), 345-354

  • Bode, C.A., Wang, J., He, Q.P. & Edgar, T.F. (2007), Run-to-run control and state estimation in semiconductor manufacturing (invited), Annual Reviews in Control. Vol. 31, 241-253

  •  He, Q.P., Wang, J., Pottmann, M. & Qin, S.J. (2007), A Curve fitting method for detecting valve stiction in oscillating control loops, Industrial & Engineering Chemistry Research, Vol. 46(13), 4549-4560

  • Wang, J. & He, Q.P. (2007), A new Bayesian approach for fast disturbance detection and classification in microelectronics manufacturing, IEEE Transactions on Semiconductor Manufacturing, Vol. 20(2), 126-136.

  • Wang, J. & Qin, S.J. (2006), Closed-loop subspace identification using the parity space, Automatica, Vol. 42(2), 315-320.