Vishwani D. Agrawal is the James J. Danaher Professor of Electrical and
Computer Engineering at Auburn University, Alabama. He has over thirty years
of industry and university experience, working at Bell Labs, Murray Hill, NJ;
Rutgers University, New Brunswick, NJ; TRW, Redondo Beach, CA; IIT, Delhi, India;
EG&G, Albuquerque, NM; and ATI, Champaign, IL. His areas of expertise include
VLSI testing, low-power design, and microwave antennas.  He obtained his BE degree
from the University of Roorkee, Roorkee, India, in 1964; ME degree from the Indian
Institute of Science, Bangalore, India, in 1966; and PhD degree in electrical
engineering from the University of Illinois at Urbana-Champaign, in 1971.
He has published over 250 papers, has coauthored five books and holds thirteen
United States patents.  His textbook, Essentials of Electronic Testing for Digital,
Memory and Mixed-Signal VLSI Circuits co-authored with M. L. Bushnell, was published
in 2000.  He is the founder and Editor-in-Chief (1990-) of the Journal of Electronic
Testing: Theory and Applications, and a past Editor-in-Chief (1985-87) of the IEEE
Design & Test of Computers magazine. He is the founder and Consulting Editor of the
Frontiers in Electronic Testing Book Series of Springer.  He is a co-founder of the
International Conference on VLSI Design, and the International Workshops on VLSI
Design and Test, held annually in India.  He has served on numerous conference
committees and is a frequently invited speaker.  He was the invited Plenary
Speaker at the 1998 International Test Conference, Washington, D.C., and the
Keynote Speaker at the Ninth Asian Test Symposium, held in Taiwan in 2000.
During 1989 and 1990, he served on the Board of Governors of the IEEE Computer
Society, and in 1994 chaired the Fellow Selection Committee of that Society.
He has received seven Best Paper Awards and two Honorable Mention Paper Awards.
In 2006, he received the Lifetime Achievement Award of the VLSI Society of India,
"in recognition of his contributions to the area of VLSI test and for founding and
steering the International Conference on VLSI Design in India." In 1998, he received
the Harry H. Goode Memorial Award of the IEEE Computer Society for "innovative
contributions to the field of electronic testing," and in 1993, received the
Distinguished Alumnus Award of the University of Illinois at Urbana-Champaign, "in
recognition of his outstanding contributions in design and test of VLSI systems."
Dr. Agrawal is a Fellow of IETE-India (elected in 1983), a Fellow of the IEEE
(elected in 1986), and a Fellow of the ACM (elected in 2003). He has served on the
Advisory Boards of the ECE Departments of the University of Illinois, New Jersey
Institute of Technology, and the City College of the City University of New York.
See his websites--http://www.eng.auburn.edu/~vagrawal.