ÿþ<head> <title>Vishwani Agrawal</title> <!-- AUBURN UNIVERSITY category user username Agrawal, Vishwani contact vagrawal@eng.auburn.edu --> <center> ELEC7250-001 VLSI Testing (Spring 2005) <br> Tuesday/Thursday, 11:00AM-12:15PM, Broun 235 <br> Term Papers <br> Assigned 4-5-05, due 4-19-05 </center> </head> <body> <br> General Instructions: <br> <br> 1. Each student should select a separate topic. <br> <br> 2. Search the literature to find key papers, books, etc. <br> <br> 3. Write the term paper as a tutorial to explain the topic to your colleagues. <br> <br> 4. A four to six page term paper should contain: <br> (a) Abstract - Problem solved, main ideas, sample results. <br> (b) Introduction - Problem statement, motivation, background, organization of the paper. <br> (c) Historical note - Trace the developments from the start to present. <br> (d) Analysis and algorithms (must construct a small example to demonstrate the main ideas). <br> (e) State of the art - Provide representative results from the literature. <br> (f) Conclusion - Accomplishments and what is expected in the future. <br> (g) References - Cite at least 12 referneces (more if you can). <br> <br> 5. Submit electronic version (word or pdf), which will be made available to the class. <br> <br> <br> Term Paper Topics: <br> <br> Paper 1: Stuck-at faults. (Cheng) <br><br> Paper 2: Comparison of LFSR and CA for BIST. (Dhingra) <br><br> Paper 3: Single-input-change (SIC) vectors for delay testing. (Han) <br><br> Paper 4: Walking, marching and galloping patterns for memory test. (Kantipudi) <br><br> Paper 5: Recursive learning. (Maddela) <br><br> Paper 6: Proofs fault simulation algorithm. (Prasad) <br><br> Paper 7: Controllability and Observability. (Raghuraman) <br><br> Paper 8: Random access scan. (Ramamurthy) <br><br> Paper 9: Statistical fault simulation. (Ray) <br><br> Paper 10: Neural network method of ATPG. (Sinha) <br><br> Paper 11: Delay testing of scan circuits. (Vemula) </body>