Biographical Sketch
Professor Singh received the B.Tech. degree from IIT Kanpur, Kanpur, India, and the M.S. and Ph.D. degrees from Virginia Tech, Blacksburg, VA, USA, all in Electrical Engineering. He is currently Professor and Godbold Endowed Chair with the Department of Electrical and Computer Engineering at Auburn University in Alabama. Earlier, he served on the faculty at the University of Massachusetts in Amherst, and Virginia Tech, in Blacksburg. He has also held several visiting professorships, including at the the University of Freiburg, Germany (2012), the University of Tokyo, Japan (2018), and is a Guest Professor at the University Stuttgart, Germany in Fall 2025. He has served as consultant to many major semiconductor, test, and EDA companies around the world, including as an expert witness for several major patent litigation cases. He has authored over 300 research papers and holds international patents that have been licensed to industry. He is particularly recognized for his pioneering contributions to statistical methods in test and adaptive testing. His research interests span all aspects of VLSI technology, in particular integrated circuit test and reliability.
Professor Singh has had leadership roles as a General Chair/Co-Chair/Program Chair for dozens of international VLSI design and test conferences. He has also served on the editorial boards of several journals, including the IEEE Design and Test, and on the Steering and Program Committees of many of the major IEEE international test and design automation conferences. He served two elected terms as a Chair for the IEEE Test Technology Technical Council (2007-2011), and on the Board of Governors of the IEEE Council on Design Automation (2011-2015). He was elected Fellow of IEEE in 2002, and is a Golden Core Member of the IEEE Computer Society.
Curriculum Vitae