Published: Jan 31, 2008 4:23:20 PM
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Yiorgos Makris, associate professor of electrical engineering and computer science at Yale University will be discussing a machine learning-based test paradigm for mixed-signal/RF circuits at a design and test seminar on Friday, Feb. 1 at 4 p.m. in Broun Hall 235.
Makris received his undergraduate degree in computer engineering and informatics from the University of Patras, Greece, in 1995. He went on to receive hismaster's and doctoral degrees in computer engineering from the University of California, San Diego. He then joined Yale University where he leads the Testable and Reliable Architectures (TRELA) Laboratory. His research interests are in the areas of test and reliability of analog, digital, and asynchronous circuits and systems.
For more information, visit http://www.eng.auburn.edu/~vagrawal/COURSE/E7950_Spr08/D&TSeminar.html