Published: Nov 27, 2007 3:12:10 PM
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The Wireless Engineering Research and Education Center will host a Design and Test Seminar on Wednesday, Nov. 28 at 4 p.m. in Broun Hall 235. The speaker will be Sule Ozev, assistant professor of Electrical and Computer Engineering at Duke University.
Ozev's lecture, 'System-level and circuit-level test approaches for state-of-the-art RF transceivers,' is aimed at providing a comprehensive understanding of system-level and circuit-level test approaches and analysis of test cost and test quality. System-level techniques which aim at a quick go/no-go decision and which are geared towards specific transceiver architectures will be discussed. Circuit-level techniques that exploit structural information to reduce test cost and increase test quality will also be covered.
Ozev received a bachelor's degree in electrical engineering from Bogazici University in Istanbul and her master's and doctoral degrees in computer science and engineering, both from the University of California, San Diego. Her research interests include low-cost test approaches for integrated RF wireless circuits, process variability analysis and test development for analog circuits, diagnosis and yield improvement for analog/RF circuits, unified chip-level test scheduling approaches for mixed-signal systems, path delay variability analysis and variability tolerant digital architectures, and tolerating hard defects in microprocessors through lightweight redundancy.