Materials Characterization

The materials characterization facilities houses scanning and transmission electron microscopes (SEM and TEM), automated x-ray diffractometers, scanning tunneling microscope, thermogravimetric analysis, differential scanning calorimetry, Fourier Transform Infrared Spectroscopy, AC-impedance spectroscopy and quantitative image analysis equipment.

This page is under construction. Please check back for further updates and photos about the equipment for these labs.

Last Updated: Dec 13, 2016