This spring's seminar lineup got off to a strong start with speakers addressing a wide variety of topics ranging from general interest to the highly technical. Some early semester highlights included:
John J. Calvert, administrator for the Inventor Assistance Program at the U.S. Patent and Trademark Office, led seminars on the basics of intellectual property protection from concept to the marketplace. At the U.S. Patent and Trademark Office, Calvert's responsibilities include oversight for individual inventor programs, establishment of programs with inventor organizations, small business, and other federal agencies, and educational outreach to all levels of schools from elementary through post graduate.
Prior to becoming administrator, Calvert was responsible for supervising as many as 25 examiners in the area of textile technology and absorbent products. He also served as acting director of the Office of Independent Inventor Programs for the Undersecretary of Commerce for Intellectual Property and the director of the U.S. Patent and Trademark Office.
Irem Ozkarahan, head of the computer science department at Troy University - Montgomery discussed the integration of artificial intelligence and operations research.
Ozkarahan received her undergraduate degree in industrial engineering (IE) from Middle East Technical University in Turkey. She then went on to receive a master's degree in IE from the university of Toronto and a doctorate in industrial and management engineering from Arizona State University
Yiorgos Makris, associate professor of electrical engineering and computer science at Yale University discussed a machine learning-based test paradigm for mixed-signal/RF circuits. Makris leads Yale's Testable and Reliable Architectures (TRELA) Laboratory, and works in the areas of test and reliability of analog, digital, and asynchronous circuits and systems.
He received his undergraduate degree in computer engineering and informatics from the University of Patras, Greece, in 1995. He went on to receive his master's and doctoral degrees in computer engineering from the University of California, San Diego.
Sule Ozev, assistant professor of Electrical and Computer Engineering at Duke University, discussed system-level and circuit-level test approaches for state-of-the-art RF transceivers including system-level techniques which aim at a quick go/no-go decision and which are geared towards specific transceiver architectures and circuit-level techniques that exploit structural information to reduce test cost and increase test quality.
Ozev received a bachelor's degree in electrical engineering from Bogazici University in Istanbul and her master's and doctoral degrees in computer science and engineering, both from the University of California, San Diego.
For more information on upcoming seminars ... http://eng.auburn.edu/admin/marketing/seminars/index.html